System and method for detecting optical parameters of thin-walled closed glass chamber

A detection system and chamber technology, applied in the field of spectral analysis and laser measurement, can solve problems such as irreversible recovery and permanent damage to the chamber

Active Publication Date: 2018-10-23
SOUTHEAST UNIV
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Problems solved by technology

[0003] At present, the detection of the optical parameters of the thin-walled closed glass chamber is mainly through destructive experiments, breaking the chamber, using a vernier caliper to measure its thickness, and testing the refractive index of the chamber material through chemical experiments; this method is simple and easy , but will cause permanent damage to the chamber and cannot be restored

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  • System and method for detecting optical parameters of thin-walled closed glass chamber
  • System and method for detecting optical parameters of thin-walled closed glass chamber
  • System and method for detecting optical parameters of thin-walled closed glass chamber

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Embodiment Construction

[0032] combine figure 1 and figure 2 The invention is described.

[0033] figure 1 It is the principle diagram of the detection method of the present invention. First, the running route of the measurement signal 14 is analyzed. The measurement signal 14 enters the detection system, passes through the bandwidth filter 13, removes the influence of the power frequency signal on the measurement, and modulates the measurement signal through the square wave function 12. , after passing through the operational amplifier 11, the phase sensor interacts with the modulation signal; the following analyzes the running route of the reference signal. After the reference signal 1 passes through the phase-locked loop 2 and the internal crystal oscillator 3, the phase and frequency information is accurately obtained, and then a part of the reference The signal directly interacts with the measurement signal through the phase sensor 5, and another part of the reference signal interacts with th...

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Abstract

The invention discloses a detection system of a thin-walled closed glass chamber's optical parameters. The system comprises a light source, lock-in amplifiers, an optical chopper, a photoelectric detector, a beamsplitter, lenses, a diaphragm and a computer. The light source generates laser which enters a main optical path; spot size is adjusted through the two lenses; through the diaphragm, light spot undergoes shaping and light intensity is controlled; the input beam passes through the beamsplitter to form a reference optical path and a measurement optical path; laser of the measurement optical path passes through the surface of the chamber to be reflected into the photoelectric detector, an output signal is modulated by one of the lock-in amplifiers, and the computer is connected; and laser of the reference optical path is directly detected by the photoelectric detector, an output signal is modulated by the other lock-in amplifier, and the computer is connected. The invention also brings forward a detection method corresponding to the system. According to the invention, the problem of nondestructive testing of optical parameters (physical wall thickness and refractive index) of the thin-walled closed glass chamber is solved. The invention provides a foundation for subsequent in-depth study on ultrahigh sensitive inertia and magnetic field measuring equipment.

Description

technical field [0001] The invention belongs to the technical field of spectral analysis and laser measurement, in particular to a detection system and method for the optical parameters of the sensitive head (thin-walled closed glass chamber) of an ultra-high-sensitivity inertial and magnetic field measuring device. Background technique [0002] Based on the SERF effect atomic spin inertia and magnetic field measurement device, the angular momentum characteristics of atoms and the Larmor precession characteristics of atoms are used to measure inertia and magnetic field, and the measurement sensitivity is much higher than that of traditional devices. Ultra-high sensitive inertial and magnetic field measurement devices can serve the fields of chemical composition and structure analysis, biomolecular structure analysis, atomic spin gyroscope\magnetometer and other fields. The thin-walled closed glass chamber containing alkali metal and inert gas is the sensitive head of the ult...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/41G01B11/06
CPCG01B11/06G01N21/41
Inventor 陈熙源邹升张红
Owner SOUTHEAST UNIV
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