Filter disc directed at XRF element determination and preparation method thereof, determination box, and element determination method

Abstract

The invention provides a filter disc directed at XRF element determination and a preparation method thereof, a determination box, and an element determination method, belonging to the field of element determination. The preparation method for the filter disc comprises the following steps: respectively putting standard liquids of a plurality of elements with to-be-determined concentrations onto carriers and carrying out drying so as to obtain original filter discs; and preparing final filter discs with sizes matching with to-be-determined substances from the original filter discs, wherein standard liquids of one or more to-be-determined elements are put on the carriers. According to the invention, samples of any matrix material can be rapidly and accurately tested; one defect, i.e., the defect that to-be-tested matrixes like plastic and soil have to be used after calibration of standard substances like plastic and soil of corresponding matrixes with apparatuses, of an X-ray fluorescence spectrometer is overcome; standard matrix substance calibration apparatuses are not needed; and the advantages of direct determination, low cost, convenience and rapidness are obtained.

Description

technical field [0001] The invention relates to the technical field of substance determination, in particular to a filter for XRF element determination, a filter preparation method, a determination box, and an element determination method. Background technique [0002] XRF (x-ray fluorescence spectrometer) has the characteristics of no need for sample pretreatment (mainly digestion) and fast testing. The disadvantages are also very obvious, mainly in the large matrix effect, which relies heavily on matrix standard materials for instrument calibration. Currently, due to the type of matrix Complexity and different interferences greatly limit the promotion and application of XRF instruments. For example, taking ferroalloy as an example, if the calibration curve of low carbon alloy steel is incorrectly used in the determination of element content in stainless steel samples, the test results will vary greatly , Therefore, if you measure different types of samples, you need differ...

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Problems solved by technology

[0002] XRF (x-ray fluorescence spectrometer) has the characteristics of no need for sample pretreatment (mainly digestion) and fast testing. The disadvantages are also very obvious, mainly in the large matrix effect, which relies heavily on matrix standard materials for instrument calibration. Currently, due to the type of matrix Complexity and different interferences greatly limit the promotion and application of XRF instruments. For example, taking ferroalloy as an example, if the calibration curve of low carbon alloy steel is incorrectly used in the determination of element content in stainless steel samples, the test results will vary greatly , Therefore, if you measure different types of samples, you need different types of standards to calibrate the instrument first, for example, you need a standard sample of aluminum alloy to measure an unknown sample of aluminum alloy; if you want to measure a copper alloy, you need a copper alloy standard, otherwise the instrument Does not give accurate and reliable measurements

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