A Raman spectrometer and measurement method for measuring the surface stress of tempered glass
A Raman spectrometer and surface stress technology, which is applied in the direction of force measurement, measurement force, and measurement device by measuring the change of optical properties of materials when they are stressed, which can solve the problem of scratching the glass to be tested, affecting the measurement efficiency, time-consuming and laborious and other problems to achieve the effect of reducing the influence of stray light, improving the measurement accuracy and improving the measurement efficiency
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Embodiment 1
[0024] figure 1 A schematic structural diagram of an embodiment of the Raman spectrometer of the present invention is shown, which is also a schematic diagram of a preferred embodiment. Such as figure 1 As shown, the Raman spectrometer for measuring the surface stress of tempered glass described in this embodiment includes a light source 10, a Raman signal acquisition device, and a Raman spectrum analysis device. Half-mirror 21, microlens array 22, focusing lens 23, imaging fiber bundle 24, microsystem 25, displacement scanning control mechanism 26, the sample 40 to be tested is located on the displacement scanning control mechanism 26 at the rear end of the microsystem 25, and the displacement The scanning control mechanism 26 controls the displacement of the sample to be tested according to the measurement process, which increases the convenience of operation. The microscopic system 25 focuses the light emitted by the light source 10 on the sample to be tested 40 to generat...
Embodiment 2
[0029] This embodiment provides a method for measuring the surface stress of tempered glass using the Raman spectrometer described in Embodiment 1, which mainly includes the following steps:
[0030] 1. Set the test parameters of the Raman spectrometer so that the laser power of the light source is 2-10mw, and the exposure time of the Raman spectrometer is 2-10s.
[0031] The exposure time of the Raman spectrometer, that is, the time for the Raman spectrometer to collect the Raman signal, if the exposure time is too short, it will affect the amount of Raman signal collection, resulting in the inability to couple all the Raman signals scattered by the sample to be measured to the Raman In the spectrometer, the measurement accuracy is affected; if the exposure time is too long, the measurement efficiency will be low. Therefore, in this embodiment, setting the exposure time of the Raman spectrometer to 2-10s can ensure that the Raman spectrometer can collect enough Raman signals ...
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