Eye graph generating method based on vector network analyzer

A technology of vector network analysis and eye diagram, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve problems such as increasing time consumption, high test noise, and affecting test accuracy

Active Publication Date: 2016-05-11
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0007] Since the oscilloscope is a broadband test equipment, its test noise is much higher than that of the vector network analyzer, which will affect the accuracy of the test when generating the eye diagram
At the same time, the jitter noise of the trigger circuit and the noise of the clock recov

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  • Eye graph generating method based on vector network analyzer
  • Eye graph generating method based on vector network analyzer
  • Eye graph generating method based on vector network analyzer

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Embodiment Construction

[0062] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0063] An eye diagram generation method based on a vector network analyzer, the S-parameters in the frequency domain are obtained by testing the DUT through the vector network analyzer, the transfer function is fitted to the S-parameters in the host computer, and the speed of matrix operation is accelerated by FPGA In order to quickly obtain the time domain response, and obtain the corresponding eye diagram after statistical processing. figure 2 Based on the principle block diagram of the eye diagram generation method of the vector network analyzer, the present invention mainly includes the S parameter acquisition of the vector network analyzer, the vector matching method to obtain the transfer function, the linear state equation to obtain the transient response and the combination of the transient response to generate the eye Figure four It consists ...

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Abstract

The invention discloses an eye graph generating method based on a vector network analyzer. The generating method comprises following steps of (1) carrying out test on a to-be-tested piece via a vector network analyzer and obtaining a scattering parameter of a frequency domain, i.e., the S parameter; 2) fitting the S parameter so as to obtain a transfer function by use of a vector matching method in the vector network analyzer; 3) using a time domain type as input of the transfer function and obtaining transient time domain response of the to-be-tested piece; and 4) carrying out superposition processing on the transient time domain response and obtaining a corresponding eye graph. According to the invention, requirements on sampling speed of an analog-digital converter imposed by an eye graph test are effective reduced; fitting precision of the scattering parameter, i.e., the S parameter is improved; and eye graph test speed of the vector network analyzer is increased.

Description

technical field [0001] The invention relates to a method for generating an eye pattern based on a vector network analyzer. Background technique [0002] Traditionally, a vector network analyzer is an instrument for frequency domain testing in the field of microwave and millimeter wave design and production, and its network characteristics are analyzed by obtaining the scattering parameters (S parameters) of the tested parts. With the development of vector network analyzers in the direction of multi-function, not only new functions are added in the field of frequency domain testing, but also gradually enter the field of time domain testing. [0003] In recent years, with the rapid development of mobile communication and Internet industry, the data communication rate has reached Gbps. Microwave effects, which were rarely paid attention to in product design before, are gradually appearing in high-speed circuits, and the signal integrity problems it brings are also receiving mo...

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 袁国平刘丹梁胜利杨明飞庄志远李明太
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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