Vector arc stage switching method and device for double rotary balance mass-based dynamic magnetic steel type magnetic levitation workpiece stages
A double-workpiece and quality-balancing technology, which is applied in the photolithographic process exposure device, the pattern surface photographic process, electrical components, etc., can solve the problem of increased structure of the main machine of the lithography machine, too long measuring optical path, and moment of inertia. Large and other problems, to achieve the effect of reducing the difficulty of control and implementation, reducing the complexity, and compacting the overall structure
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0025] Below in conjunction with accompanying drawing, embodiment of the present invention is described in further detail:
[0026] A method for moving magnetic steel maglev double workpiece stage vector arc transfer method based on rotary balance quality, the method includes the following steps: in the initial working state, the first workpiece stage at the measurement position is in a pre-aligned state, and the second workpiece stage at the exposure position In the exposure state; in the first step, after the pre-alignment of the first workpiece table at the measurement position is completed, it is driven by the moving magnet to move to the predetermined position A of the measurement position for changing the table, charging and waiting, and the second workpiece table at the exposure position is exposed by the moving magnet The steel drive moves to the predetermined position C of the exposure position; in the second step, the first workpiece table and the second workpiece tab...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com