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Double-ion-source quadrupole mass spectrometer based on single-photon ionization and electron bombardment ionization

A technology of electron bombardment ionization and quadrupole mass spectrometer, which is applied in the direction of mass spectrometer, ion source/gun, dynamic spectrometer, etc. It can solve the problems of low ionization energy of organic components, complex mass spectrum, unfavorable analysis, etc.

Inactive Publication Date: 2016-06-01
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

However, since the ionization energy of organic components may be low, after the ionization of the analyte is bombarded by a high-energy ion source, more fragment ions will be generated in the analyte, making the mass spectrogram more complicated, which is not conducive to its analysis. Analytical, especially difficult when analyzing complex mixtures

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  • Double-ion-source quadrupole mass spectrometer based on single-photon ionization and electron bombardment ionization

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Embodiment Construction

[0025] see figure 1 , is a structural representation of the present invention. The double ion source quadrupole mass spectrometer of the present invention consists of a single photon ionization source 1, an electron bombardment ionization source 2, an ionization transmission region cavity 3, a quadrupole mass analyzer cavity 4, a focusing lens group A5, and a focusing lens group B13, differential interface plate 6, differential interface aperture 7, sampling capillary A9, sampling capillary B10, quadrupole mass analyzer 8, detector 18, vacuum pump A11, vacuum pump B12, and side pumping valve 14.

[0026] The quadrupole mass spectrometer of the present invention works in the dual ion source mode of single photon ionization source 1 and electron bombardment ionization source 2 .

[0027] The light beam emitted by the single photon ionization source 1 is located inside the cavity 3 of the ionization transmission area, the light beam is parallel to the direction of the electrode ...

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Abstract

The invention discloses a double-ion-source quadrupole mass spectrometer based on single-photon ionization and electron bombardment ionization, and particularly relates to a quadrupole mass spectrometer which can flexibly switch ionization modes according to physical and chemical properties of an analyzed sample. The quadrupole mass spectrometer comprises the components of a single-photon ionization source, an electron bombardment ionization source, an ionization transmission region chamber, a quadrupole mass analyzer chamber, a focusing lens set A, a focusing lens set B, a differential interface pole plate, a differential interface small hole, a sample inlet capillary A, a sample inlet capillary B, a quadrupole mass analyzer, a detector, a side suction valve, a vacuum pump A and a vacuum pump B.

Description

technical field [0001] The invention relates to a quadrupole mass spectrometer, in particular to a quadrupole mass spectrometer based on single photon ionization and electron bombardment ionization dual ion sources. The quadrupole mass spectrometer is based on conventional electron bombardment ionization, combined with single photon ionization, which can reasonably switch the ionization mode according to the physical and chemical properties of the analyzed substance. Background technique [0002] Conventional quadrupole mass spectrometers usually use electron bombardment ionization (EI) to ionize the analyte. This ionization source uses electrons with 70eV energy to bombard the substance and ionize it. Each substance can get its own characteristic spectrum. , can accurately conduct qualitative analysis. However, since the ionization energy of organic components may be low, after the ionization of the analyte is bombarded by a high-energy ion source, more fragment ions will ...

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Application Information

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IPC IPC(8): H01J49/42H01J49/10
CPCH01J49/107H01J49/147H01J49/162H01J49/4215
Inventor 李海洋李庆运花磊赵无垛蒋吉春
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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