Double-ion-source quadrupole mass spectrometer based on single-photon ionization and electron bombardment ionization
A technology of electron bombardment ionization and quadrupole mass spectrometer, which is applied in the direction of mass spectrometer, ion source/gun, dynamic spectrometer, etc. It can solve the problems of low ionization energy of organic components, complex mass spectrum, unfavorable analysis, etc.
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[0025] see figure 1 , is a structural representation of the present invention. The double ion source quadrupole mass spectrometer of the present invention consists of a single photon ionization source 1, an electron bombardment ionization source 2, an ionization transmission region cavity 3, a quadrupole mass analyzer cavity 4, a focusing lens group A5, and a focusing lens group B13, differential interface plate 6, differential interface aperture 7, sampling capillary A9, sampling capillary B10, quadrupole mass analyzer 8, detector 18, vacuum pump A11, vacuum pump B12, and side pumping valve 14.
[0026] The quadrupole mass spectrometer of the present invention works in the dual ion source mode of single photon ionization source 1 and electron bombardment ionization source 2 .
[0027] The light beam emitted by the single photon ionization source 1 is located inside the cavity 3 of the ionization transmission area, the light beam is parallel to the direction of the electrode ...
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