3D Micro/Nano Measuring Probe

A measurement probe, micro-nano technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of low sensitivity and precision of strain gauge detection, easy fracture of silicon film structure, uneven stress distribution, etc., and achieve convenient manual adjustment , low cost, good stability
CN105758335BActive Publication Date: 2018-05-01HEFEI UNIV OF TECH

Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Patents(China)
Current Assignee / Owner
HEFEI UNIV OF TECH
Publication Date
2018-05-01

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Abstract

The invention discloses a high-precision wide-measuring-range three-dimensional micro-nano measuring probe. The high-precision wide-measuring-range three-dimensional micro-nano measuring probe is characterized in that a measuring probe unit and a measuring unit are fixedly connected through a support part, the measuring probe unit of the probe is provided with a two-layer suspension structure, a front-end suspension structure body is provided with a planar reflecting mirror and a measuring probe needle, and a rear-end suspension structure body is fixedly provided with a light blocking blade and connected with the front-end suspension structure body through a connecting probe rod; the measuring unit has a beam splitter prism used for splitting light source beams into reflected light and transmission light, the light intensity of the reflected light is changed due to Z-direction linkage of the light blocking blade, the reflected light irradiates a first four-quadrant detector, and the transmission light irradiates a second four-quadrant detector through reflection of three planar reflecting mirrors; displacement and two-dimensional angle measurement on the planar reflecting mirrors is achieved through detection signals output by the first four-quadrant detector and the second four-quadrant detector. The high-precision wide-measuring-range three-dimensional micro-nano measuring probe can achieve the detection effects of being high in precision and sensitivity, wide in measuring range, small in measuring force and high in stability.
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Description

technical field

[0001] The invention relates to the field of three-dimensional micro-nano measurement, more specifically, a high-precision and large-range three-dimensional micro-nano measuring probe applied to a nano-coordinate measuring machine, which can sense the three-dimensional shape of the surface of an object. Background technique

[0002] With the rapid development of nanotechnology, all walks of life are competing to launch a technological revolution in the miniaturization of devices, and micro devices with sizes between millimeters and microns have come out one after another. Especially with the rapid development of MEMS (Micro-Electro-Mechanical System) device processing technology, various tiny devices with nanoscale as the standard have emerged. MEMS products such as micro-turbine, micro-needle array, gear-driven micro-motor, micro-lens, micro-nozzle and micro-gear. The geometric structure of these micro-devices is becoming more and more complex, and the geom...

Claims

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