3D Micro/Nano Measuring Probe
Patent Information
- Authority / Receiving Office
- CN ยท China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HEFEI UNIV OF TECH
- Publication Date
- 2018-05-01
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Abstract
Description
technical field
[0001] The invention relates to the field of three-dimensional micro-nano measurement, more specifically, a high-precision and large-range three-dimensional micro-nano measuring probe applied to a nano-coordinate measuring machine, which can sense the three-dimensional shape of the surface of an object. Background technique
[0002] With the rapid development of nanotechnology, all walks of life are competing to launch a technological revolution in the miniaturization of devices, and micro devices with sizes between millimeters and microns have come out one after another. Especially with the rapid development of MEMS (Micro-Electro-Mechanical System) device processing technology, various tiny devices with nanoscale as the standard have emerged. MEMS products such as micro-turbine, micro-needle array, gear-driven micro-motor, micro-lens, micro-nozzle and micro-gear. The geometric structure of these micro-devices is becoming more and more complex, and the geom...