Semiconductor package method, semiconductor package piece, and method for manufacturing dynamic random access memory

A dynamic random access and packaging method technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve the problem of increasing DRAM manufacturing, packaging costs, memory wafer structure accuracy, and reliable electrical performance. It can achieve the effect of expanding read and write speed, reducing size, and high transmission rate

Inactive Publication Date: 2016-08-03
GALAXYCORE SHANGHAI
View PDF3 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method needs to add additional semiconductor layers to make micro pads and butt pads, which increases the cost of DRAM production and packaging. In addition, the bonding structure accuracy and electrical performance reliability of the memory wafer and the second wafer butt pads There is also uncertainty

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor package method, semiconductor package piece, and method for manufacturing dynamic random access memory
  • Semiconductor package method, semiconductor package piece, and method for manufacturing dynamic random access memory
  • Semiconductor package method, semiconductor package piece, and method for manufacturing dynamic random access memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0041] Secondly, the present invention is described in detail using schematic diagrams. When describing the embodiments of the present invention in detail, it is used as an example for convenience of explanation. The schematic diagrams are only examples, which should not limit the protection scope of the present invention.

[0042] In the drawings, the proportions of shapes of elements may be exaggerated or reduced for clarity, and corresponding numerals refer to corresponding elements throughout. It will also be understood...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention provides a semiconductor package method which comprises a step of providing a memory wafer with the formation of a dynamic random access memory and a plurality of first silicon through hole connection pads, a step of providing a logic wafer with the formation of a logic chip and a plurality of second silicon through hole connection pads, and a step of electrically connecting the first silicon through hole connection pads and the second silicon through hole connection pads through a silicon through hole mode, and realizing the wafer level package of the memory wafer and the logic wafer. A super wide bus is directly connected to the silicon through hole connection pads on the metal layer of a surface, the electrical connection with an external logic wafer is realized through the silicon through hole technology, and the reading and writing bit width and reading and writing speed of the dynamic random access memory are extended.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a semiconductor packaging method, a semiconductor packaging component and a manufacturing method of a dynamic random access memory. Background technique [0002] Dynamic Random Access Memory (DRAM, Dynamic Random Access Memory) has the characteristics of large capacity, high speed, and low unit cost, so it is extremely versatile. After long-term development, DRAM has developed a variety of multi-generation products. For example, in the high-performance field, it has evolved from the first generation of DDR to the fifth-generation DDR5, and in low-power applications, it has evolved from LPDDR to LPDDR2. [0003] Such as figure 1 As shown, the current mainstream DRAM generally includes: a storage array 10, a control logic circuit 20 and an interface conversion logic circuit 30. The storage array 10 includes a large number of storage units for storing data, and occupies the largest ar...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/98H01L21/768H01L25/065H01L23/48
Inventor 赵立新俞大立李怀兆
Owner GALAXYCORE SHANGHAI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products