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Dual-probe scanning ion conductance microscope system based on balanced bridge and its imaging method

A technology of scanning ion conductance and microscope system, which is applied in the field of scanning ion conductance microscopy, can solve the problems of reducing the speed of SICM scanning and imaging, and achieve good human-computer interaction performance, improved anti-interference ability, and nanoscale resolution.

Active Publication Date: 2019-01-18
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the jump mode inevitably reduces the scanning imaging speed of SICM greatly, and its scanning process is still affected by ion current drift

Method used

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  • Dual-probe scanning ion conductance microscope system based on balanced bridge and its imaging method
  • Dual-probe scanning ion conductance microscope system based on balanced bridge and its imaging method
  • Dual-probe scanning ion conductance microscope system based on balanced bridge and its imaging method

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Embodiment Construction

[0030] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0031] like figure 1Shown, the double-probe configuration SICM system based on balanced electric bridge of the present invention comprises double-probe scanning configuration unit, core control unit and upper computer operating unit, and double-probe scanning configuration unit mainly consists of double probes (scanning probe and reference Probe), scanning platform, bridge configuration circuit, preamplifier (that is, preamplifier current power amplifier), etc., the core control unit is mainly composed of 16-bit AD and DA, FPGA control chip, drive module, etc., the upper computer operating unit It is mainly composed of upper computer and so on. Through the design of the bridge balance circuit, the current feedback signal of the SICM system under the double-probe configuration is output, and then the Z-direction movement of the scanning probe is contr...

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Abstract

The invention discloses a dual-probe scanning ionic conductive microscope system based on a balance bridge and an imaging method thereof. The dual-probe scanning ionic conductive microscope system based on the balance bridge comprises a dual-probe scanning configuration unit, a core control unit and an upper computer operation unit; the dual-probe scanning configuration unit comprises a bridge configuration module and a scanning platform; a core control unit comprises a signal collection module, a piezoelectric ceramics control module, a micro machine control module and a signal output module; and the upper computer operation unit comprises an upper computer operation interface and a serial port communication module between the upper computer and a FPGA chip. The dual-probe scanning ionic conductive microscope system based on the balance bridge can better overcome the ion current drift, and improves the quality and stability of the scanning image. The invention can perform scanning imaging on the surface three-dimension appearance of a biologic sample under a biological environment, and can realize the non-contact, nanometer grade resolution and stable scanning.

Description

technical field [0001] The invention belongs to the field of scanning ion conductance microscopes, relates to configuration modes of scanning ion conductance microscope probes, in particular to a dual-probe scanning ion conductance microscope system based on a balanced bridge circuit and an imaging method thereof. Background technique [0002] Scanning Ion Conductance Microscopy (SICM) is an emerging member of the family of scanning probe microscopes. Due to its special imaging mechanism, it can realize non-contact and nanoscale resolution scanning imaging of biological samples under physiological conditions, so SICM has significant advantages in the field of imaging of living cells. In recent decades, SICM technology has developed rapidly and has been widely used in many fields such as biology, chemistry, and materials. [0003] In 1989, Hansma's research team first proposed and developed SICM, and then Korchev's research team made improvements on this basis, and successfu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/44G01N23/225
CPCG01N23/225G01Q60/44
Inventor 庄健李泽清焦阳博瀚尚春阳
Owner XI AN JIAOTONG UNIV
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