Star catalogue material bidirectional scattering distribution function testing method

A star surface material and two-way scattering technology, which is applied in the measurement of scattering characteristics, material analysis through optical means, and analysis of materials, etc., can solve the problems of ignoring the change of scattering characteristics, large calculation amount of ABg model, and low error accuracy, and achieve data Accurate and reliable, operable and adaptable results

Active Publication Date: 2016-08-24
SHANGHAI SATELLITE ENG INST
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Problems solved by technology

The scattering characteristics of the scattering surface are generally described by the bidirectional scattering distribution function (BRDF). Most of the existing testing methods are to directly measure the scattering characteristics of the surface material samples, which ignore the state changes of the samples after the stars are installed. Changes in the scattering properties of
Moreover, most stray light analysis software adopts the BRDF represented by the ABg model mathematically. However, the ABg model has a large amount of calculation and the error accuracy is not high. It is necessary to seek a faster and more accurate calculation model.

Method used

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  • Star catalogue material bidirectional scattering distribution function testing method
  • Star catalogue material bidirectional scattering distribution function testing method
  • Star catalogue material bidirectional scattering distribution function testing method

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Embodiment Construction

[0030] The technical solutions of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0031] The present invention uses the whole star state to test the star catalog material, and adopts the BRDF test method, that is, the isotropic scattering intensity measured by using the light source to irradiate the surface of the material is compared with the scattering intensity of the same light source of the standard diffuse reflection plate. The test requirements for optical satellites are as follows:

[0032] (1) Input conditions

[0033] Spectral range: 400 ~ 1000nm, spectral interval 10nm;

[0034] Incident angle: Azimuth: 0°; Elevation: 0°~60°, interval 5°

[0035] Emission angle: Azimuth: 0°; Elevation: -70°~70°, interval 5°

[0036] (2) Technical requirements

[0037] In the experiment, a monochromator is used to separate the spectrum of the xenon lamp into each wavelength as required, and the bidirectional r...

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Abstract

The invention provides a star catalogue material bidirectional scattering distribution function testing method. The method solves the problem that a star catalogue material influences stray light testing under a whole-satellite state and includes the steps that firstly, a xenon lamp spectrum is divided into multiple wavelengths according to requirements by means of a monochromator; secondly, a specific wavelength spectrum and specific light-out and light-in angles are selected for output voltage testing of a standard board and a star catalogue material under the whole-satellite state and hemisphere reflectivity testing of the standard board along with wavelength changes; thirdly, the spectrum wavelengths are changed through the monochromator, a satellite space angle is precisely changed by means of a two-dimensional rotary measuring system, accordingly the light-out and light-in angles of light are changed, and the second step is executed again; fourthly, an improved anisotropic Gaussian model is built; fifthly, the improved Gaussian model based on anisotropy is adopted for BRDF computation. The method has the advantages that the method is reasonable, operation is feasible, quick and efficient, adaptability is high and data is accurate and reliable, and is applicable to stray light testing under the whole-satellite state of an optical satellite.

Description

technical field [0001] The invention relates to a method for testing the stray light of optical loads in the full star state of spacecraft such as satellites. Background technique [0002] The stray light in the whole star state is closely related to the satellite layout design and the scattering characteristics of the star catalog materials. The stray light suppression design of the optical system of the load, the rationality analysis of the whole star layout, and the design of the stray light test plan all need to carry out stray light analysis and simulation. Therefore, before carrying out the stray light test in the full-star state, it is necessary to test the scattering characteristics of the star catalog material in the full-star state, so as to substitute it into the stray light simulation software for more accurate simulation and analysis of stray light in the full-star state. The stray light test results can also be traced back to determine the sensitive stray sourc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/47
CPCG01N21/4738G01N2021/4711
Inventor 汪少林马文佳杨春燕何军
Owner SHANGHAI SATELLITE ENG INST
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