Production method for oxide semiconductor thin film transistor
A technology for oxide semiconductors and thin film transistors, used in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., to solve problems such as loss of semiconductor characteristics, unprotected active layers, and failure of switching characteristics of oxide semiconductor thin film transistors , to achieve the effect of reducing contact resistance, maintaining switching characteristics, and high electron mobility
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0041] In order to further illustrate the technical means adopted by the present invention and its effects, the following describes in detail in conjunction with preferred embodiments of the present invention and accompanying drawings.
[0042] see Figure 11 , the invention provides a method for manufacturing an oxide semiconductor thin film transistor, comprising the following steps:
[0043] Step 1. Please refer to figure 1 , providing a substrate 1 on which a first metal layer 2' is formed.
[0044] Specifically, the substrate 1 is a transparent substrate, preferably a glass substrate, and the first metal layer 2' may be a single-layer metal structure, such as being composed of only one layer of molybdenum (Mo), or a multi-layer metal laminated structure, For example, two layers of molybdenum sandwich a layer of aluminum (Al), or a layer of molybdenum is superimposed on a layer of titanium (Ti). The thickness of the first metal layer 2' is 100nm-400nm. In the step 1, t...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 