Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Analog counting circuit used for single photon detector

A single-photon detector and counting circuit technology, applied in the field of microelectronics, can solve the problems affecting the filling factor of pixel units, large occupied area, complex structure, etc., and achieve the effects of large counting range, improved filling factor, and high filling factor.

Inactive Publication Date: 2016-11-09
NANJING UNIV OF POSTS & TELECOMM
View PDF7 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the digital readout circuit has the characteristics of better noise suppression, detection sensitivity and low noise, it has a complex structure and takes up a large area.
Usually a digital readout circuit requires hundreds of transistors, seriously affecting the fill factor of the pixel unit

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analog counting circuit used for single photon detector
  • Analog counting circuit used for single photon detector
  • Analog counting circuit used for single photon detector

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0020] The present invention simulates the above-mentioned linear analog counting circuit based on capacitor discharge based on the CMOS 0.18 μm process. The simulation parameters are as follows: the counting capacitor C is 500 fF, the pulse width of the avalanche pulse signal CLK is 10 ns, and the period is 20 ns; based on the above simulation parameters, The present invention has carried out the simulation of duration 13μs, and obtains as follows figure 2 The simulation results shown in Fig. The abscissa in the figure is the simulation time, and the ordinate is the voltage value at the output terminal. In the initial stage, the counting capacitor C is charged to 2V. Subsequently, every time the circuit detects an avalanche pulse signal, the voltage value on the counting capacitor C will decrease a little, and the voltage waveform will decrease in a stepwise manner. In this mode, the waveform of the output terminal voltage also shows a good linear change with the simulatio...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a linear analog counting circuit based on capacitor discharging. The circuit is constituted by a counting capacitor C and eight NMOS tubes. The eight NMOS tubes comprise an MN0, an MN1, an MN2, an MN3, an MN4, an MN5, an MN6, and an MN7. The MN0 is a signal input switch, and the MN1, the MN2, the MN3, and the MN4 are used to form an improved Wilson current mirror. The MN5 is a reset switch, and an MOS tube MN 6 and an MOS tube MN7 are used to form a voltage following circuit, which is used as the output stage of the circuit, and the output stage of the circuit is used to output the final counting results of the counting capacitor. The counting circuit has advantages of small circuit area, high filling coefficient, high linearity, large counting range, and applicability in counting of number of photons of high-density, full-integration, and low-cost SPAD array detector.

Description

technical field [0001] The invention relates to a linear analog counting circuit applied in a single photon detector, which belongs to the technical field of microelectronics. Background technique [0002] At present, integrating a high-density, large-scale single-photon avalanche diode (SPAD) array detector including signal processing circuits on a single chip is one of the main development trends of the SPAD array detector. The function of the counting circuit is to count the number of avalanche pulses, which is the key circuit of the SPAD detector; the large-scale counting circuit is the most important factor affecting the increase of the array density. Therefore, reducing the area of ​​the counting circuit is of great significance to the research of realizing a high-density, fully integrated, and low-cost SPAD array detector. [0003] The counting circuit of the traditional SPAD array detector adopts the way of digital counting, directly processes the avalanche pulse ge...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 徐跃黄杨向平
Owner NANJING UNIV OF POSTS & TELECOMM
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products