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Method for generating digital modulating signal waveform data by AWG

A digital modulation signal and waveform data technology, applied in the direction of electrical digital data processing, digital data processing components, digital function generators, etc., can solve unrelated problems and achieve the effects of increased flexibility, easy debugging, and convenient program control

Active Publication Date: 2016-11-16
10TH RES INST OF CETC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Digital modulation signal is a commonly used signal in the fields of communication, data transmission, etc., but the current literature research work does not involve the generation of digital modulation signals by arbitrary waveform generators.

Method used

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  • Method for generating digital modulating signal waveform data by AWG
  • Method for generating digital modulating signal waveform data by AWG
  • Method for generating digital modulating signal waveform data by AWG

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Embodiment Construction

[0018] refer to figure 1 , figure 2 . There are three basic modulation methods for transmitting digital signals: amplitude keying, frequency shift keying, and phase shift keying, which correspond to transmitting digital baseband signals with the amplitude, frequency, and phase of sine waves, respectively. The parameters related to the generation of digital modulation signal waveforms are: carrier center frequency f 0 , symbol rate R s , the number of symbols L and the sampling rate f s . According to the present invention, select the carrier center frequency f that simultaneously satisfies the arbitrary waveform parameters 0 , symbol rate R s Combined with the number of symbols L, the sampling rate f of the three conditions s and the total sampling time T total ; At the same time, the sampling rate f of the waveform file is satisfied s Satisfy the Nyquist sampling rate theorem, and not higher than the maximum operating frequency f of the digital-to-analog converter ...

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Abstract

The invention provides a method for generating digital modulating signal waveform data by an AWG, and aims at disclosing a digital modulating signal waveform data generation method which is capable of generating stable and low-distortion output signals, keeping the continuity and integrity of signal waveform files and not causing phase jump during cyclic reading. The method is realized through the following steps of: selecting a combination of a carrier center frequency f0, a symbol rate Rs and a code element number L, which satisfy any waveform parameter at the same time; when a sampling rate fs of the waveform files satisfies a Nyquist sampling rate theorem and is not higher than a DAC highest working frequency and the sizes of the a waveform files satisfy a storage capacity, searching an optimum sampling total time length Ttotal and fs to ensure that a generated actual carrier center frequency f'0 approaches to f0 in the aspect of waveform; and cyclically searching a sampling total time, the sampling rate and a finely tuned carrier center frequency parameter, solving an optimum waveform parameter, and generating signal waveform files which are connected end to end and do not cause phase jump during cyclic reading.

Description

technical field [0001] The invention relates to a device that can be widely used in the testing of various complete machines, systems, components and components, as various simulation signal or excitation signal generators or signal sources for short, for arbitrary waveform generators AWG to generate digital modulation signal waveforms The method of data, more specifically, provides an optimized design method for the generation of digital modulation signal waveform files of arbitrary wave generators. technical background [0002] In the test system, the stimulus signal source is used as an input device, and no parameters are directly tested. Its function is to provide excitation signals for the system under test, or generate simulation signals, and simulate the signals required by electronic equipment with the same characteristics as the actual environment, and its performance indicators are closely related to the objects under test. In the electronic experiment and test pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F1/03
CPCG06F1/0321
Inventor 唐婷杜瑜
Owner 10TH RES INST OF CETC
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