Base station circuit fault loop device and fault processing method

Abstract

The invention provides a base station circuit fault loop device and a fault processing method. The base station circuit fault loop device comprises a DB44 Abis interface in a base station, and pins corresponding to an E1 circuit system are in short circuit in the DB44 Abis interface to form a loop. The DB44 Abis interface with the pins in the short circuit is connected with a first DB44 interface or a second DB44 interface; a data packet is sent by a webmaster, so that an Abis circuit data packet is returned to a BSC side of a base station controller, and a network management tool of the BSC analyzes whether a returned circuit signal parameter meets an electrical index; or the Abis circuit forms a closed loop of the base station on an outer side of a base station transceiver platform BTS, and judges a circuit state according to the state of an indicator lamp of a base station transmission circuit board; and a circuit fault of the Abis interface is quickly found by the above steps. The base station circuit fault loop device provided by the invention can quickly and conveniently locate and process the original difficult faults and technological problems and improve the working efficiency.

Description

technical field [0001] The invention relates to the field of base station circuit fault processing in the technical field of base station communication, in particular to a base station circuit fault looper and a fault processing method. The present invention is mainly used to solve the difficult problem of fault diagnosis and processing of the Abis interface circuit in the current base station communication system; especially through the self-developed looper, each Abis circuit interface is respectively looped, combined with the indicator light status of the base station transmission circuit interface board (Down loop), or the method of sending data packets in the circuit loop (Up loop), to analyze, determine and eliminate the faults of various network element circuits in the base station equipment and outside the base station equipment. Background technique [0002] The Abis interface is defined as the communication interface between the two functional entities BSC (Base St...

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Problems solved by technology

[0004] The Abis circuit is a link between the base station and the BSC used to transmit signaling and services. There are many nodes in the link, and the number of links is huge. Usually, the number of Abis links in the local network reaches more than 10,000, and it is a part with a high incidence of faults. Data configuration involving SDH channels of optical transmission equipment, data configuration of BTS and BSC, SDH equipment, E1 circuit equipment interfaces, transmission optical fibers, E1 cables; internal transmission circuit boards, cross-connect time slots, and various interface circuits of BTS and BSC etc.; therefore, accurate analysis and location of fault points is the key to eliminate such faults, but because the interface between the Abis circuit and the base station is a DB44 interface, traditional instruments and detection methods do not have this interface, and it is impossible to connect this part of the circuit Incoming loops are detected and analyzed, which makes it impossible to locate such faults

[0005] Traditional fault handling methods cannot accurately locate faults, and cannot accurately distinguish transmission, base station boards, or related interface faults, and involve coordination and cooperation between multiple disciplines, resulting in a large amount of human resources and maintenance costs; In order to deal with a fault, it is often necessary to go back and forth multiple times and replace different boards of the equipment; if multiple professionals are required to go there, the car mileage will often run hundreds of thousands of kilometers; at the same time, the method of replacing the circuit boards of the base station with potential faults one by one, Caused the base station to restart and drop repeatedly, seriously affecting the network quality and user perception

[0006] The traditional fault location currently only has the loop line, which is used with the bit error tester, and can only be used on the DDF rack, and loops one E1 / T1 circuit at a time; but in the downward circuit of the DDF rack, it is daily For the high incidence of faults, the above-mentioned traditional test methods cannot detect and diagnose loops

In the existing technology, the location and investigation of many circuit faults often require multiple round trips to the equipment site; The journey was more than 1,000 kilometers, which took up more than 20 working days of several professional technical backbones, not only wasting gasoline and human resources, but also brought a lot of workload due to the centralized complaints from users, and the faulty base station brought a lot of trouble to the network. Quality issues, resulting in a decline in user perception

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