A multi-channel t/r component testing device and method

Abstract

The invention discloses a multi-channel T / R component testing device and method, wherein the device includes a transceiver signal separation network, and the transceiver signal separation network includes at least one combiner, and each branch end of the combiner passes through A four-port network is connected to the transmit output / receive input of the multi-channel T / R component, and the transmit input / receive output of the multi-channel T / R component is respectively connected to the T / R component performance testing instrument through the instrument distribution network; The combining end of the combiner is also connected to the T / R component performance testing instrument through the instrument distribution network; the instrument distribution network is also connected to the signal source, and the signal source is used to provide input signals for the multi-channel T / R component ; The sending and receiving signal separation network and the instrument distribution network are all connected to the controller; the four-port network includes two working states, one working state is to form two vertical microwave channels, and the other working state is to form two Transverse microwave channel.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a multi-channel T / R component testing device and method. Background technique [0002] With the rapid development of microwave and millimeter wave integration technology, multi-channel has become one of the development trends of T / R components. In the development and production process of multi-channel T / R components, in addition to testing the performance index of a single Test the performance index between multiple T / R components, and at the same time as a multi-channel T / R array composed of multiple T / R components, it also puts forward verification requirements for the synthesized power. [0003] Due to the variety and quantity of performance indicators of multi-channel T / R components, the test time requirements are high. At present, the test of multi-channel T / R components generally adopts the automatic test scheme. In the automatic test system, it is used as the ...

AI Technical Summary

Problems solved by technology

[0005] At present, the design idea of ​​integrating switch, combining and attenuation is adopted. The switch combination is relatively large and the cost is high. At the same time, in order to verify the combining power, it is necessary to perform matching processing on the combining path. The difficulty and workload of debugging are very high. Large, relatively high labor costs, and at the same time, due to the large scale, it has brought great challenges to testability and maintainability.

Images