Temperature control circuit for silicon drift detector

Abstract

The invention provides a temperature control circuit for silicon drift detector, comprising: a main control circuit, a first power supply circuit and a second power supply circuit. The first power supply circuit and the second power supply circuit are connected with the main control circuit. The first power supply circuit is a boost power supply circuit; the second power supply circuit is an anti-phase power supply circuit. The boost power supply circuit is connected with an internal temperature detection circuit and an environmental temperature detection circuit. The main control circuit is connected with a temperature feedback circuit through a serial port circuit. The environmental temperature detection circuit is connected with the temperature feedback circuit. The main control circuit and the temperature feedback circuit are connected with a temperature regulating and controlling circuit to solve the problems in the prior art that temperature cannot be preset according to environment, that temperature control response is slow and the fluctuation is large, and that the stable time for the refrigeration temperature of the silicon drift detector is long and the refrigeration temperature is not low enough.

Description

technical field [0001] The invention belongs to the technical field of analytical instruments, in particular to a temperature control circuit for a silicon drift detector. Background technique [0002] In recent years, the world chemical analysis instrument market has reached 40 billion US dollars. X-ray fluorescence spectroscopy is an environmentally friendly, fast, non-destructive and accurate chemical analysis technology, which is widely used in environmental protection, consumer product safety, industrial testing and analysis and other fields. X-ray fluorescence spectrometer is an essential tool for modern chemical analysis and one of the most widely used chemical analysis instruments. It has been adopted by international standard detection methods such as RoHS (toxic and hazardous substances) detection. The drift controller is the main device for spectral analysis in the X-ray fluorescence spectrometer. Because of its convenient and quick use, it can analyze a wide rang...

AI Technical Summary

Problems solved by technology

[0011] The present invention proposes a temperature control circuit for a silicon drift detector, which solves the problem that the temperature value cannot be preset according to the environment in the prior art, the temperature control response is slow and the fluctuation is relatively large, the refrigeration temperature of the silicon drift detector is stable for a long time and the refrigeration temperature is not enough low problem

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