Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Antenna optimization method capable of combining moment method with confidence region space mapping algorithm

A technology of space mapping and optimization method, which is applied in computing, instrumentation, electrical digital data processing, etc., and can solve the problems of late application of space mapping algorithm, difficulty in finding mathematical analysis formula of equivalent circuit, complex antenna structure, etc.

Active Publication Date: 2017-04-26
NANJING UNIV OF SCI & TECH
View PDF2 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Due to the complex structure of the antenna, it is difficult to find the corresponding equivalent circuit or the appropriate mathematical analysis formula, so the space mapping algorithm is applied relatively late on the antenna.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Antenna optimization method capable of combining moment method with confidence region space mapping algorithm
  • Antenna optimization method capable of combining moment method with confidence region space mapping algorithm
  • Antenna optimization method capable of combining moment method with confidence region space mapping algorithm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0107] In order to verify the correctness and effectiveness of the method in this paper, the microstrip double-loop antenna is optimized as follows: figure 1 shown. The microstrip double-loop antenna has three dielectric layers, and the relative permittivity from bottom to top is: ε r1 =2.2,ε r2 =1.07,ε r3 =2.2, the dielectric loss of each layer is tanδ=0.001, and the thickness of the annular microstrip patch is 0.05mm. The optimal design variables are the inner and outer radii of the annular microstrip, the feeding position of the probe, the thicknesses of the first and second dielectric layers, and the length of the dielectric layer, expressed as x=[a 1 a 2 b 1 b 2 ρ d 1 d 2 l 1 l 2 ] T . The radius of the probe and the thickness of the uppermost dielectric layer are fixed values, r 0 = 0.325mm, d 3 = 0.254 mm. Design initial value x init =[10,15,30,30,20,6,8,100,100] T mm

[0108] The design objectives of the microstrip dual-loop antenna are:

[01...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an antenna optimization method capable of combining a moment method with a confidence region space mapping algorithm. The method comprises the following steps that: firstly, a rough model for an antenna space mapping algorithm is established, the construction of the rough model adopts a response surface approximation method based on a Kriging interpolation, the rough model is optimized, and the optimal design parameter of the rough model is determined; a fine model adopts a full wave analysis moment method, the response of the rough model is enabled to approach to the response of the fine model through parameter extraction, and a mapping relationship between a rough model parameter and a fine model parameter is established; and the optimal design parameter of the rough model and the inverse mapping of the established mapping relationship are utilized to obtain the predication parameter of the fine model, and if the predication parameter of the fine model does not meet design requirements, iterative update is carried out on the mapping relationship until the predication parameter of the fine model meets the design requirements. By use of the method, the parameter of the designed antenna is integrally optimized, and time is saved on the premise that accuracy is guaranteed.

Description

[0001] a technical field [0002] The invention belongs to the technical field of antenna optimization design, in particular to an antenna optimization method combining the method of moments and space mapping of confidence domains. [0003] Two background technology [0004] In the antenna design process, when the antenna structure is complex and there are many design parameters, the optimization time is unacceptable, and sometimes even the antenna with the required performance cannot be obtained. Aiming at these problems in antenna design, the space mapping algorithm is adopted, which converts the traditional time-consuming optimization problem into the optimization of a fast and efficient alternative model through the mapping relationship, avoiding the direct optimization of the antenna model by using time-consuming full-wave electromagnetic simulation. optimization, which can greatly reduce design time. [0005] Due to the complexity of the antenna structure, it is difficul...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50
Inventor 陈如山李骏丁大志樊振宏徐娟
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com