Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Double-incident slit high-resolution imaging spectral system

A high-resolution, imaging spectrum technology, applied in the field of double-slit incident imaging spectroscopy system, can solve the problems of increasing system volume and cost, difficult high spectral resolution, expensive cost, etc., to meet the requirements of fast revisit time and high spectral resolution efficiency, simple structure

Inactive Publication Date: 2017-05-24
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In push-broom imaging spectrometers, to achieve high resolution and fast revisit times with guaranteed signal-to-noise ratios, larger systems are often required, as well as more expensive
In the fiber optic imaging spectrometer, on the basis of ensuring that the various performance indicators remain unchanged, expanding the field of view will inevitably increase the volume and cost of the system
[0007] Therefore, it is difficult for current imaging spectrometers to simultaneously satisfy high spectral resolution, high image quality, fast revisit time, low cost, and high integration of space systems.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-incident slit high-resolution imaging spectral system
  • Double-incident slit high-resolution imaging spectral system
  • Double-incident slit high-resolution imaging spectral system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] Provide a preferred embodiment of the present invention below in conjunction with figure, mainly be used as further specifying the characteristics of the present invention in detail, rather than being used for limiting the scope of the present invention:

[0035] figure 1 It is a schematic diagram of the optical path of the double-slit hyperspectral imaging system of the specific embodiment of the present invention. See attached figure 1 , the double-strip radiation signal from the target is imaged on the double slit 1 of the field diaphragm after passing through the front-end telescope system, and the radiation energy passing through the double slit 1 is reflected to the convex reflective grating 3 through the concave reflector 2 , to separate the light of different wavelengths, after being reflected by the convex reflective grating 3, the light of different wavelengths is reflected to the concave reflective secondary mirror 4 along different angles, reflected by the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses a double-incident slit high-resolution imaging spectral system. The double-incident slit high-resolution imaging spectral system is composed of double incident slits, a beam splitting subsystem and a detection subsystem; the beam splitting subsystem includes a main reflector, a convex grating, a secondary reflector and a correction lens; and the detection subsystem includes a filter and a surface array detector. The system has the advantages of high resolution, short re-visiting time, lower cost and highly-integrated space system. A double-slit structure enables the system to obtain spectral information of two target areas simultaneously with observation performed for once, so that re-visiting time can be shortened; and the main reflector, the convex grating and the secondary reflector are designed to be concentric, and therefore, the aberration of the system can be reduced, and the resolution of the system can be improved.

Description

technical field [0001] The present invention relates to a double-slit incident imaging spectroscopic system, in particular to a spectroscopic imager with high resolution, high image quality, long slit, and fast revisit time that can be used in ground telescope systems, spaceborne, and airborne spectral imagers Optical system design. [0002] technical background [0003] The spectral imager was developed on the basis of multispectral remote sensing imaging technology in the 1980s. It can obtain super multispectral images of scenes and targets with high spectral resolution, and has a wide range of applications in atmospheric, ocean and land observations. The spectral imager is an organic combination of imaging technology and spectral technology. Through continuous spectral measurement in the continuous imaging space, the "qualitative, quantitative, timing, and positioning" analysis and dynamic process detection of the target can be achieved, and the spatial information of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28G01J3/02G01J3/04
CPCG01J3/021G01J3/0297G01J3/04G01J3/2823
Inventor 朱雨霁尹达一魏传新
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products