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Solid-state imaging device

一种固体摄像装置、计数值的技术，应用在测量装置、辐射控制装置、图像通信等方向，能够解决ΔV不均、难测量等问题

Active Publication Date: 2017-05-24
PANASONIC INTPROP MANAGEMENT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The measurement of the number of photons incident on the light receiving element is achieved by comparing the reset voltage with the voltage of the holding unit when the accumulated amount of ΔV is subtracted. Therefore, it is difficult to perform accurate measurement due to the unevenness of ΔV.

Method used

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Experimental program
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Effect test

Embodiment approach 1

[0031] First, refer to figure 1 as well as figure 2 Next, the pixel circuit 1 of the unit pixel of the solid-state imaging device according to the present embodiment will be described. figure 1 It is a circuit block diagram showing the functional configuration of a unit pixel of the solid-state imaging device according to this embodiment. figure 2 It is a circuit diagram showing an example of a circuit configuration of a unit pixel of the solid-state imaging device according to the present embodiment.

[0032] The solid-state imaging device according to this embodiment includes a plurality of pixels arranged in a matrix. Each of a plurality of pixels (unit pixel) has figure 1 The pixel circuit 1 is shown. Such as figure 1 As shown, the pixel circuit 1 includes a detection unit 10 , a counter value holding unit 20 , and a readout unit 30 .

[0033] The detection unit 10 includes a light receiving unit 11 , a reset unit 12 , and an AD conversion amplifier 13 . The detec...

Embodiment approach 2

[0103] Next, a solid-state imaging device according to Embodiment 2 will be described.

[0104] In the photon detection operation described in Embodiment 1, when the number of photons incident on the light receiving element APD increases, as Figure 4 As shown, the voltage Vcount(n) as the count value may not increase linearly. in addition, Figure 4 The correspondence relationship between the number of photons incident on the light receiving element APD and the count value in the solid-state imaging device according to Embodiment 1 is shown.

[0105] As can be seen from the above (Equation 1) to (Equation 3), when the difference between the output voltage Vchg of the inverter AMP2 and the count value Vcount(n-1) decreases, ΔV(n) which is an analog voltage gradually decreases. Finally, when the voltage Vcount(n−1) becomes equal to the voltage Vchg, ΔV(n) becomes 0, and accumulation stops. The count value (accumulation count) can be increased by setting the initial voltage V...

Embodiment approach 3

[0132] Next, a solid-state imaging device according to Embodiment 3 will be described.

[0133] In the solid-state imaging device according to this embodiment, as in Embodiment 2, the count value is divided into high-order bits and low-order bits and stored. In Embodiment 2, an example was described in which the high-order bits of the count value are held as digital values ​​and the low-order bits of the count value are held as analog values. In this embodiment, the low-order bits of the count value are held Bit Hold as Digital Value Holds the high-order bits of the count value as an analog value.

[0134] Use the following Figure 8 as well as Figure 9 First, the pixel circuit of the unit pixel of the solid-state imaging device according to the present embodiment will be described. Figure 8 It is a circuit block diagram showing the functional configuration of a unit pixel of the solid-state imaging device according to this embodiment. Figure 9 It is a circuit diagram s...

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Abstract

A solid-state imaging device is provided with: a detection unit (10) having an avalanche amplification-type photodetector (APD) for detecting a photon and a reset unit (12) for resetting the output potential of the photodetector (APD), and outputting a digital signal indicating the presence of photon incidence on the photodetector (APD); a count-value-holding unit (20) for holding the digital signal outputted from the detection unit (10) as a count value by converting the digital signal into an analog voltage and counting the converted data; and a readout unit (30) for outputting the count value as an analog signal.

Description

technical field [0001] The present application relates to a solid-state imaging device, for example, to a solid-state imaging device that detects weak light. Background technique [0002] In recent years, in various fields such as medical treatment, biology, and radiation measurement, there is a need for a weak light sensor that can accurately measure weak light as small as about one photon (Photon). Currently, a photomultiplier tube (Photomultiplier Tube: PMT) is widely used as a faint light sensor. [0003] However, the PMT, which is a vacuum tube device, needs to have a size of about 10mm×10mm even if it is small, so it is difficult to realize multi-pixel. Moreover, when using PMT to perform imaging, it is necessary to first collect information of each point of the subject by scanning the subject in the XY plane, and then perform image processing. For this reason, it is difficult to realize instant shooting. In view of this situation, in order to simultaneously increas...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/374H01L27/146H04N5/3745H04N5/378
CPCG01J2001/4466G01J1/44H04N25/76H04N25/77H04N25/78H04N25/773H04N23/71H04N25/75G01J2001/442H01L31/107
Inventor 春日繁孝山平征二加藤刚久
Owner PANASONIC INTPROP MANAGEMENT CO LTD
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