Uniform irradiation secondary optical reflector design method based on quantum measure

Abstract

The invention discloses a uniform irradiation secondary optical reflector design method based on quantum measure. The method comprises the steps of dividing a light source and an irradiated plane into grids, finding a correspondence between the light source and the irradiated plane, computing a freeform surface, filling the freeform surface to form a reflector, taking optimal simulation software to perform simulated computation, and if uniformity of photon irradiance of the irradiated plane cannot meet the requirement, repeating the above steps, and modifying grid parameters, until the photon irradiance of the irradiated plane meets the requirement. Compared with the secondary optical design based on radiation measure and optical measure, the method provided by the invention is more accurate in the field of optical design of plant illumination lights, so that more uniform photon irradiance on a using surface of the plant illumination light is achieved instead of more uniform illuminance and optical radiancy on the using surface of the same, and the method can meet the plant need for light better, and is more beneficial to growth of the plant, wide in application range, and applicable to the fields of greenhouse supplementary lights or plant factories.

Description

technical field [0001] The invention relates to non-imaging optics, in particular to a design method of a secondary optical reflector based on quantum measurement uniform illumination. Background technique [0002] With the rapid development of plant physiology, optical technology, and LED technology, as well as the increasing number of China's facility agriculture, especially greenhouses and greenhouses, more and more high-power LEDs are applied to plant lighting. Since plants have relatively high requirements on light uniformity, it is necessary to carry out secondary optical design on ordinary plant lighting LED lamps to obtain suitable reflectors to meet the requirements of optical uniformity. However, all the secondary optical designs currently on the market use the radiance unit system and the photometric unit system, such as the law of energy conservation. This method does not use the secondary optical design of the quantum measurement system for plant illumination. ...

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Problems solved by technology

[0004] Based on the problems existing in the above-mentioned prior art, the present invention proposes a design method of a secondary optical reflector based on quantum measurement, which is used to solve the problem that the radiance and luminosity of the two measurement unit systems of the current secondary optical design cannot meet the needs of plants. Requirements for secondary optical design of multi-color mixed light of lighting fixtures

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