Method and device for measuring high temperature through micro spectrometer

A micro-spectrometer and spectrometer technology, applied in measuring devices, optical radiation measurement, radiation pyrometry, etc., can solve the problems of inability to meet the needs of aerospace and national defense projects, large measurement errors, and high prices, and achieve light weight and low cost. Low, good stability

Inactive Publication Date: 2017-05-31
HANGZHOU DIANZI UNIV
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Problems solved by technology

[0003] Generally speaking, the energy method based on Fourier transform infrared spectrometer to measure high temperature is the main development direction in recent years. However, due to the limitation of the measurement band of infrared spectrometer, the maximum measurement temperature is generally about 2000 ℃, which cannot meet the requirements of some aerospace and national defense projects. needs
In addition, because the infrared spectrum is restricted by factors such as the ambient atmosphere, atmospheric atmosphere, and atmospheric infrared window, the measurement error is relatively large (~5%)
Finally, large volume, high price, and poor stability are also disadvantages of temperature measurement based on Fourier transform infrared spectrometer

Method used

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  • Method and device for measuring high temperature through micro spectrometer
  • Method and device for measuring high temperature through micro spectrometer
  • Method and device for measuring high temperature through micro spectrometer

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Embodiment Construction

[0030] Embodiments of the present invention will be described below with reference to the drawings.

[0031] Principle of the present invention: the distribution formula of the energy density of blackbody radiation with frequency is:

[0032]

[0033] In formula (4), h is Planck's constant, υ is the frequency of radiation, c is the speed of light, k is Boltzmann's constant, and T is the temperature of the measured object. Since the general object to be measured cannot be an absolute black body, the energy density formula should be revised as:

[0034]

[0035] In formula (5), e(υ) is the emissivity, which is generally less than 1. Since the emissivity of an object is related to the composition, crystal structure and surface state of the object (including the surface temperature, surface roughness, and the presence of surface oxide layer, surface impurities or coatings) and other factors. Therefore, unless the composition, crystal structure, and surface state of the obj...

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Abstract

The invention discloses a method and device for measuring high temperature through a micro spectrometer. According to the method, the micro spectrometer is used for measuring thermal radiation energy intensity of an object in the wave band range of 200-1000 nm, certain conversion and fitting are conducted on a thermal radiation energy intensity curve, and the temperature of the measured object can be calculated. The measurement temperature range of the method is 1000-10000 K. The method has the advantages of being high in temperature measurement upper limit, high in speed, high in measuring precision, good in stability and not limited by material surface appearance, emissivity and other factors. The device mainly comprises an optical system, a CCD spectrometer and a data processing unit, and has the advantages of being simple in structure, low in cost, small in size, low in weight, convenient to carry and the like.

Description

technical field [0001] The invention belongs to the technical field of high temperature measurement and relates to a method and device for measuring high temperature by using a miniature spectrometer, which is suitable for various occasions requiring non-contact high temperature measurement. Background technique [0002] The conventional non-contact pyrometry technology mainly measures the thermal radiation energy emitted by the object, and uses the Stefan-Boltzmann equation to determine the temperature of the object to be measured. Such as single-wavelength radiation temperature measurement, dual-wavelength colorimetric temperature measurement, multi-wavelength radiation temperature measurement, and spectral emissivity measurement based on Fourier transform infrared spectrometer. Another method of measuring temperature using thermal radiation is to use a Fourier transform infrared spectrometer to measure the radiation wavelength corresponding to the maximum value of radiati...

Claims

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Application Information

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IPC IPC(8): G01J5/00G01J5/08
CPCG01J5/00G01J5/0803G01J5/0821
Inventor 毛启楠季振国
Owner HANGZHOU DIANZI UNIV
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