Method and system based on differential phase contrast imaging reduction quantitative phase image

A differential phase contrast, phase image technology, applied in microscopes, measuring devices, measuring optics, etc., can solve the problem of inability to directly detect the phase distribution of light

Inactive Publication Date: 2017-05-31
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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In optical measurement, due to the high frequency of light wav...

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  • Method and system based on differential phase contrast imaging reduction quantitative phase image
  • Method and system based on differential phase contrast imaging reduction quantitative phase image
  • Method and system based on differential phase contrast imaging reduction quantitative phase image

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Embodiment Construction

[0070] The specific implementation of the present invention will be further elaborated in conjunction with the accompanying drawings in the following description. The embodiments here are only used to illustrate the present invention, but are not used to limit the scope of the present invention.

[0071] Such as figure 1 Shown is the schematic diagram of the principle of the LED array light source microscopic imaging system, based on the quantitative phase reduction microscopic imaging system provided by the present invention, the intensity I(r of the coherent point light source in the camera c )for:

[0072] I(r c )=|∫∫[∫∫q(r)o(r)exp(-i2πr·u″)d 2 r]P(u″)exp(-i2πu″·r c ) d 2 u″| 2 (1)

[0073] Among them, the illumination function of the LED array light source is q(r), the transmission function of the sample to be tested is o(r), and the transformation functions of other optical devices are P(u″), r c is the coordinate of the focal plane of the camera, u is the coordin...

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Abstract

The invention discloses a method and system based on a differential phase contrast imaging reduction quantitative phase image, and relates to the field of the computer imaging. The stable method from a target image to a reduction quantitative phase image is established. The method is capable of firstly establishing a differential phase contrast imaging two-dimensional optical phase transfer function H(u), and establishing the relation between the H(u), a frequency domain function of a differential phase contrast image (the figure is as shown in the specification) and the quantitative phase information, finally executing the deconvolution operation to recover the quantitative phase information through the phase transfer function of the differential phase contrast imaging. The method is capable of further researching a method of quantitatively recovering the phase information under the asymmetrical illumination pattern formed by multi-axis division so as to enhance the reconstitution capacity of the phase information in the different directions, and using the mathematical optimization to reduce the frequency noise increase caused by the direct deconvolution. The method is capable of overcoming the defects that the traditional quantitative image acquisition operation is complicated and the imaging condition is rigorous, and the obtained image resolution is higher.

Description

technical field [0001] The invention relates to the technical field of phase imaging, in particular to a method for restoring a quantitative phase image based on a differential phase contrast image and a quantitative phase reduction microscopic imaging system based on an LED array light source. Background technique [0002] In some specific fields, such as optical measurement, material physics, adaptive optics, X-ray diffraction optics, electron microscopy, biomedical imaging, etc., most samples are phase objects. The amplitude transmittance distribution of such objects is uniform, but the spatial distribution of refractive index or thickness is not uniform, so the light wave amplitude of the phase object changes very little, but the phase change is very large. The human eye or other photodetectors can only judge the change of the amplitude of the object but not the change of its phase, so they cannot distinguish the parts with different thickness or refractive index in the ...

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Application Information

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IPC IPC(8): G01J9/00G02B21/36
CPCG01J9/00G02B21/365
Inventor 刘子骥熊兴李成世张鸿波余段辉蒋亚东
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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