A kind of preparation method of abs standard sample for X-ray fluorescence spectrometry analysis

Abstract

The invention provides a preparation method of an ABS (acrylonitrile butadiene styrene) standard sample for X-ray fluorescence spectrometry. The method comprises steps as follows: S1, a powdery raw material containing target metal elements is prepared and screened with a 400-mesh screen; S2, ABS resin with the content of target metal elements lowering than a detection limit of an instrument is selected, and no antioxidant and no plasticizer are contained in the ABS resin as is determined; S3, a lubricant with the mass accounting for 2 per mill-3 per mill of that of the ABS resin is added, and the ABS resin and the lubricant are mixed uniformly; S4, the additive amount of metal is determined in the rules shown in the specification according to the requirements for the content of metal in a standard sample; S5, the powdery raw material and the ABS resin mixed in S3 are put into a high-speed mixer and mixed at a lower speed for the first time; a few quantity of lubricants are added and mixed at a higher speed for the second time; S6, the mixed materials are heated, melted and subjected to extrusion molding and granulation in an extruder; the granular material is made into standard samples. According to the method, the standard samples with the metal content approaching to target content can be obtained and are very uniform and good in repeatability.

Description

technical field [0001] The invention belongs to a method for preparing a standard sample for analysis, in particular to a method for preparing an ABS standard sample for X-ray fluorescence spectrum analysis. Background technique [0002] The European Union promulgated the WEEE Directive and the ROHS Directive in 2003, prohibiting or restricting the use of electronic and electrical equipment products containing harmful substances such as lead (Pb), mercury, cadmium, and hexavalent chromium, which has increasingly restricted my country's foreign trade in this field. How to effectively respond to this instruction has become a serious concern for manufacturers of electronic and electrical products in our past. For this reason, there is an urgent need for a fast and accurate method for testing harmful substances in electrical and electronic products. The current analysis methods mostly use ion emission spectrometry analysis, but this method is cumbersome to the pretreatment of s...

AI Technical Summary

Problems solved by technology

The current analysis methods mostly use ion emission spectrometry analysis, but this method is cumbersome to the sample pretreatment, and there are problems that the detection data may be different due to factors such as matrix differences and concentration gradients.

X-ray fluorescence spectrometer can perform non-destructive multi-element analysis, and has the advantages of fast, accurate, simple, and high precision. However, in the process of identification, the acquisition of standard samples is relatively expensive, and losses are unavoidable in the process of sample preparation. , often the actual sample prepared deviates greatly from the standard sample, or there is inhomogeneity, poor reproducibility, etc.

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