Method and device for measuring working temperature of slow wave structure of helical traveling wave tube

A technology of working temperature and slow wave structure, which is applied in the field of vacuum electronics, can solve the problems of placing it in it, affecting the working state of the traveling wave tube, and affecting the distribution of the electromagnetic field, so as to achieve the requirement of reducing the speed, accurate distribution of working temperature in the tube, and convenient Processing effect

Active Publication Date: 2019-07-30
SOUTHEAST UNIV
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Problems solved by technology

However, due to the small space inside the shell of the traveling wave tube and the need to maintain a vacuum state inside the shell, it is difficult to place the temperature sensor in it; When the temperature sensor is placed in it, it will affect the distribution of the electromagnetic field, thus affecting the normal working state of the traveling wave tube

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  • Method and device for measuring working temperature of slow wave structure of helical traveling wave tube
  • Method and device for measuring working temperature of slow wave structure of helical traveling wave tube
  • Method and device for measuring working temperature of slow wave structure of helical traveling wave tube

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Embodiment Construction

[0045] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0046] In the present invention, the traveling wave tube for testing adopts a certain type of 200W traveling wave tube provided by Twelve; the optical fiber adopts the gold-plated optical fiber AS19 / 125 / 155G of FiberGuide Company, the core diameter is 9 μm±0.5 μm, and the cladding diameter is 125 μm+1 / -3μm, the outer armor diameter is 155μm±16μm, the test temperature range is -269 to +700℃; the demodulator adopts the demodulator produced by China Metrology Institute; the data processing device adopts an ordinary desktop computer.

[0047] The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0048] figure ...

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Abstract

The invention provides a method for measuring the working temperature of a slow wave structure of a helical traveling wave tube and a corresponding working temperature measuring device. The device includes traveling wave tube, optical fiber, demodulator and data processing device. Wherein, at least one FBG grating is written on the optical fiber, and the optical fiber is connected to the data processing device through the demodulator. The innovation of the present invention lies in that in the present invention, the optical fiber extends into the casing of the traveling wave tube and is fixed on the side steps of the clamping rod inside the casing. The lead-out part of the optical fiber is coated with a metal coating to ensure the mechanical strength of the optical fiber and the airtightness of the traveling wave tube. The measuring device provided by the invention can measure the working temperature of several points inside the traveling wave tube under the working state of the traveling wave tube. Moreover, the measuring device provided by the present invention has little influence on the electromagnetic field distribution in the traveling wave tube, and has little influence on the working performance of the traveling wave tube.

Description

technical field [0001] The invention belongs to the field of vacuum electronics, in particular to a novel helical traveling wave tube slow wave structure, and provides a distributed testing method and device for the temperature inside the helical traveling wave tube. Background technique [0002] As a high-frequency signal amplifier, the helical traveling wave tube has the advantages of wide frequency band and high power, and is the core device in radar, communication, and electronic countermeasure systems. Temperature is one of the important factors affecting the reliability and stability of traveling wave tubes. When the temperature inside the tube is high, the slow-wave structure will undergo thermal deformation, and its high-frequency characteristics will change, which will affect the working characteristics of the traveling wave tube. Experiments have proved that overheating of the helix at the output end will cause the output power of the TWT to drop. When the temper...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K11/32G01K11/3206
CPCG01K11/3206
Inventor 孙小菡张劲袁慧宇赵兴群
Owner SOUTHEAST UNIV
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