Electron impact ion source carrier gas ion removing device
A technology of electron bombardment of ions and carrier gas, which is applied in the field of gas chromatography-mass spectrometry, can solve problems such as complexity, energy loss, and unsatisfactory removal of carrier gas ions, and achieve the effects of reducing impact, reducing noise, and simple structure
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[0023] Such as figure 1 As shown, this embodiment provides an electron bombardment ion source carrier gas ion removal device, which sequentially includes an electron bombardment ion source, an ion focusing lens 3, a radio frequency quadrupole 6, a time-of-flight analyzer 7 and a detector 8 , the sample and the carrier gas are first ionized by the electron bombardment ion source, and then focused by the ion focusing lens 3, the carrier gas ions are removed by the RF quadrupole 6, and the sample ions reach the time-of-flight analyzer 7 through the RF quadrupole 6 , finally reach the detector 8, the radio frequency quadrupole 6 is arranged between the ion focusing lens 3 and the time-of-flight analyzer 7, the placement direction of the radio frequency quadrupole 6 along the rod length is the same as the transmission direction of the carrier gas ions, four The support rods are connected with radio frequency circuits, and a sine wave of a certain frequency is coupled to any pair of...
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