Automatic zeroing device for low-frequency mechanical spectrum test instrument

Abstract

The invention relates to an automatic zeroing device for a low-frequency mechanical spectrum test instrument. The automatic zeroing device comprises a base, a frame arranged on the base, a photoelectric converter arranged on the frame and capable of sliding horizontally, a synchronous belt transmission mechanism arranged on the base and driving the photoelectric converter to slide under the drive of a stepping motor, and a zeroing circuit used for collecting the signal of the photoelectric converter to control the movement of the stepping motor. The zeroing circuit comprises two silicon photocell groups which are arranged on the photoelectric converter and adopt differential connection, and a stepping motor subdivision driver which is connected with the stepping motor through a line. One silicon photocell group is connected with an instrument amplifier and then connected to a principal computer. The other silicon photocell group is connected with a subtracter, then connected to a zeroing comparator and a bipolar V / F converter, and then connected to the stepping motor subdivision driver. One silicon photocell group is used for collecting spot vibration signals, and the other silicon photocell group is used for quickly zeroing the photoelectric converter. The automatic zeroing device has functions of self-locking and fine tuning.

Description

technical field [0001] The invention relates to the field of low-frequency mechanical spectrum testing, in particular to an automatic zeroing device for a low-frequency mechanical spectrum testing instrument. Background technique [0002] The low-frequency mechanical spectrum tester is an important instrument for studying the properties of materials such as force, electricity, and magnetism. It can detect the internal structure, defects and dislocations of materials, and study the movement laws of grain boundaries or phase interfaces. [0003] At present, the low-frequency mechanical spectrum testers used in China are generally self-developed. For example, the Institute of Modern Testing Technology of Suzhou Vocational University developed the LMA-1 low-frequency mechanical spectrum tester in 2004; The plane mirror on the top converts the vibration of the sample into the displacement of the parallel light spot, and converts the displacement of the light spot into a voltage s...

AI Technical Summary

Problems solved by technology

[0003]At present, the low-frequency mechanical spectrum testers used in China are generally developed by themselves. For example, the Modern Testing Technology Research Institute of Suzhou Vocational University developed the LMA- Type 1 low-frequency mechanical spectrum tester; the tester uses the plane mirror on the vertical swing rod to convert the vibration of the sample into the displacement of the parallel light spot, and converts the displacement of the light spot into The voltage signal is collected by the host computer to measure the mechanical spectrum of the sample; however, during the test process, the light spot is easy to deviate from the zero position, which may cause one of the silicon photocells to fail to irradiate light when the light spot vibrates with the sample, resulting in test failure. Failed; the existing solution is to control the position of the photoelectric transducer through the upper computer to drive the screw nut transmission mechanism, and continuously adjust it to return to zero. Since the position of the photoelectric transducer is adjusted through the upper computer, on the one hand, the upper The working task of the machine, on the other hand, the screw nut transmission mechanism needs to be continuously adjusted back and forth, and there is excessive position adjustment, which leads to a long adjustment time, affects the entire testing process of the material, and even leads to the loss of some important data

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