Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Time domain self-correlated flat fading channel modeling method

A technology of flat fading channel and modeling method, which is applied in the field of time domain autocorrelation flat fading channel modeling, can solve problems such as inability to accurately describe flat fading channels, and achieve the effects of good scalability, improved performance, and easy implementation.

Active Publication Date: 2017-11-21
HEFEI UNIV OF TECH
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a time-domain autocorrelation flat fading channel modeling method, aiming to solve the problem that the flat fading channel cannot be accurately described in the existing simulation methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time domain self-correlated flat fading channel modeling method
  • Time domain self-correlated flat fading channel modeling method
  • Time domain self-correlated flat fading channel modeling method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] The present invention will be further described below in conjunction with the accompanying drawings and implementation methods.

[0043] refer to figure 1 The flat fading channel modeling method of the present invention includes the following steps: program start, parameter initialization U1, generation of flat fading channel U2, statistical analysis of flat fading channel U3, and program end.

[0044] After the program starts, the parameter initialization U1 can be carried out. Without loss of generality, we set the maximum Doppler frequency shift f of the flat fading channel d =500Hz, system sampling frequency f s =15000Hz, system sampling points N=10 6 .

[0045] After the parameter setting is completed, the flat fading channel U2 can be generated. The two Gaussian white noise random sequences are input into the flat filter to generate colored Gaussian white noise random sequences with flat Doppler power spectrum, respectively, and respectively constitute the rea...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a time domain self-correlated flat fading channel modeling method. The method comprises the following steps: firstly simulating a flat fading channel through a computer, and verifying the flat fading channel; mainly comprising the following steps: firstly initializing a parameter which comprises a maximum Doppler frequency shift, system sampling frequency, system sampling point number N, and a flat filter correlated parameter; a method for producing the flat fading channel is as follows: inputting a flat filter through two paths of Gauss white noise random sequences, thereby respectively producing a colored Gauss white noise random sequence with the flat Doppler power spectrum, and respectively forming a real part and a virtual part of a flat fading channel; and finally, performing one-order and two-order statistical analysis on the flat fading channel, and then designing a channel hardware simulation system. By using the method disclosed by the invention, the Rayleigh channel flat Doppler power spectrum is convenient to realize by using a forming filter, namely, the flat filter, and the envelope obeys the Rayleigh distribution.

Description

technical field [0001] The invention relates to the field of wireless channel modeling, in particular to a time domain autocorrelation flat fading channel modeling method. Background technique [0002] The classical Rayleigh channel model describes the multipath effect and Doppler effect of wireless channels in a small scale, and is the most important and basic simulation model of wireless communication channels. The channel model can well describe the state of the mobile wireless communication channel in the urban environment without direct rays, and under this model, the channel phase angle statistics obey the Rayleigh distribution, the phase angle statistics obey the uniform distribution, and its Doppler The power spectrum is a classic Jakes power density function, showing a U-shaped spectrum. However, in an indoor environment, especially when wireless communication occurs between floors, it can be assumed that electromagnetic waves arrive at the receiving end uniformly ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/391
CPCH04B17/391H04B17/3911H04B17/3912
Inventor 何怡刚黄源程彤彤吴裕庭史露强李兵何鎏璐
Owner HEFEI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com