Multi-infeed direct current commutation failure quick assessment method
A multi-infeed DC and commutation failure technology, which is applied to AC network circuits, power transmission AC networks, instruments, etc., can solve problems such as the inability to fully measure the impact of faults, achieve rapid scanning, and avoid misjudgment effects
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0042] The method in this embodiment is used to evaluate the commutation failure of multi-infeed DC, and its process is as follows figure 1 As shown, it mainly includes the following steps:
[0043] 1) Calculate the multi-feed interaction factor M of any two direct currents i and j in the n-return direct current feed-in system IIFji And the multi-infeed effective short-circuit ratio M of each return DC scr , where, i=1, 2,..., n, j=1, 2,..., n, i≠j;
[0044] 2) Let the bus at the fault point be F, and calculate the self-impedance Z of the bus F FF And the mutual impedance between the bus F and the commutation bus of each DC inverter station;
[0045] 3) Denote the initial voltage of bus F as U F0 , use the formula (1) to estimate the transient voltage drop of the n-circuit DC inverter station commutation busbar when the three-phase metallic short circuit occurs on the busbar F:
[0046]
[0047] In the formula, M is an n×n full-rank matrix, and its n diagonal elements ar...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com