A sample stage for loading electromechanical coupling uniaxial tension device

Abstract

The invention discloses a sample stage for loading a force-electricity coupling uniaxial tensiling device. The sample stage comprises a basal body, a base, a sample stage circuit board, a sample stage locating piece, an insulated cover piece and screws, wherein the sample stage circuit board, the sample stage locating piece and the insulated cover piece are stacked on the base of the sample stage in sequence from bottom to top, and are fixed by four screws, and the base is fixed to the front surface of the basal body by the other screws. The sample stage has the characteristics of small size, simple structure, reliable performance, simple and convenient installation, convenient operation and wide application scope, the defect that one-dimensional and two-dimensional micro-nano materials cannot be subjected to uniaxial force-electricity coupling tensile testing in a nano indenter instrument is overcome, and multiple coupling tests under barometric pressure are easy to realize by combining other test methods.

Description

technical field [0001] The present invention relates to the field of elastic strain research of micro-nano materials, relates to a method and device applied to a multi-field (force, electricity, heat, light) joint characterization system of micro-nano materials, and specifically relates to a mechanical processing technology and a circuit board manufacturing technology The sample stage used to load the electromechanical coupling uniaxial tension device of micro-nano materials. Background technique [0002] John J. Gilman, a world-renowned scholar in the field of material mechanics, explained the theoretical strength of materials (under this stress, the bonds between atoms will be Spontaneous breaking or switching) and drastic electronic structure changes (such as the closing of the semiconductor band gap). Because almost all physical and chemical properties of materials depend on the electronic structure, and the electronic structure must undergo drastic changes before the a...

AI Technical Summary

Problems solved by technology

However, the device currently has the following disadvantages: First, the electromechanical coupling uniaxial tension device is only used with TEM in-situ sample rods, and the use environment is limited to high-vacuum TEMs

However, there is no sample stage for loading the electromechanical coupling uniaxial tension device that can be used in the nanoindenter, which cannot meet the current research requirements on the elastic strain engineering of micro-nano materials at the microscopic scale.

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