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Ultra-compact femtosecond electron diffraction apparatus

A compact technology of electron diffraction, applied in the field of electron diffraction, can solve problems such as difficult to break through 100 femtosecond time resolution, and achieve the effect of reducing electronic pulse broadening

Active Publication Date: 2017-12-08
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0016] The purpose of the present invention is to provide an ultra-compact femtosecond electron diffraction device for the technical problem that the existing ultrafast electron diffraction device is difficult to break through the time resolution of 100 femtoseconds

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  • Ultra-compact femtosecond electron diffraction apparatus
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  • Ultra-compact femtosecond electron diffraction apparatus

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Embodiment Construction

[0048] The present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0049] like figure 1 An ultra-compact femtosecond electron diffraction device is shown, including a femtosecond laser source 1, a beam splitter 2, a frequency tripler device 3, an optical delay line 4, a vacuum chamber 5, a femtosecond electron gun 6, an image enhancement module 7 and image acquisition system 8.

[0050] After the femtosecond laser emitted by the femtosecond laser source 1 passes through the beam splitter 2, a beam of femtosecond laser enters the frequency tripler device 3 to generate an ultraviolet laser pulse, which is irradiated on the femtosecond electron gun 6 through a reflector to generate detection electrons. pulse; another femtosecond laser as a pump laser pulse enters the optical delay line 4 and then is irradiated on the sample 9 through a mirror, and the image enhancement module 7 is used to enhance the signal elect...

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Abstract

The invention relates to the technical field of electron diffraction and provides an ultra-compact femtosecond electron diffraction apparatus aiming at the technical problem that the conventional ultrafast electron diffraction apparatus difficultly breaks through the 100-femtosecond time resolution. The ultra-compact femtosecond electron diffraction apparatus comprises a femtosecond laser source, beam splitter, a frequency tripling device, an optical delay line, a vacuum chamber, a femtosecond electron gun, an image enhancement module and an image acquisition system, wherein the femtosecond electron gun and the image enhancement module are sequentially arranged in the vacuum chamber along an emergence direction of an ultraviolet laser pulse; the image acquisition system is arranged on the outer part of the vacuum chamber and aligned at the image enhancement module; the femtosecond electron gun comprises a cathode and an anode arranged parallel to the cathode; the anode comprises an anode electrode and a sample supporting net; a central stepped hole which completely penetrates through the anode electrode is formed in the center of the anode electrode; a larger hole of the central stepped hole is positioned on the anode surface far away from the cathode; and the sample supporting net is fixedly arranged in the central stepped hole.

Description

technical field [0001] The invention relates to the technical field of electron diffraction, in particular to an ultra-compact femtosecond electron diffraction device. Background technique [0002] Based on the pioneering work of Ahmed Zewail et al. in the 1990s, ultrafast electron diffraction (UED) with atomic-level spatiotemporal resolution has been widely used in chemical reactions, structural phase transitions, charge density waves, and protein functions. Ultrafast structural dynamics studies. [0003] The most important feature of this technology is the time-resolving capability of the system. The influencing factors are: the pulse width of the pump laser, the speed mismatch and the pulse width of the probe electrons, etc. Among them, the longitudinal broadening Δt of the ultrafast probe electron pulse caused by the space charge The time resolution of the system plays a decisive role and can be expressed as: [0004] [0005] where m is the electron mass, e is the ...

Claims

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Application Information

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IPC IPC(8): G01N23/20
CPCG01N23/20025G01N23/20058G01N2223/307G01N2223/0565Y02A50/30
Inventor 罗端田进寿惠丹丹王兴温文龙卢裕
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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