Fixed node mobile phone automation testing device

Abstract

The invention discloses a fixed node mobile phone automation testing device. The fixed node mobile phone automation testing device comprises a Raspberry Pi, a customized testing circuit h and more than one mobile phone clamping devices. The customized testing circuit comprises a master control chip, a power supply in signal communication with the master control chip, an USB-to-serial-port chip, an USB interface physical control A module, a current detection module, a multifunctional extension port, an OLED display screen, a rotary encoder and a first USB interface, wherein the first USB interface is in series connection with the output terminal of the USB interface physical control A module and the first USB interface, the current detection module and the USB interface physical control A module constitute a current detection loop. The fixed node mobile phone automation testing device is small in volume and light in weigh, easy to deploy in clusters and flexible to clamp and install and low in power consumption and can be used in various simple working environments. Furthermore, the fixed node mobile phone automation testing device is simple in task issuing, high in scene coverage and can satisfy wide testing requirements for different mobile phones.

Description

Technical field [0001] The invention relates to a fixed node automatic test equipment, in particular to a fixed node mobile phone automatic test equipment with small volume, high scene coverage and wide test range. Background technique [0002] With the popularity of smart phones and the acceleration of the R&D update process, efficient and comprehensive testing of smart phones has become a key to the finalized production and quality assurance of mobile phones. Among them, automated testing found that the number and quality of BUG are declining, and the coverage of the scene is not up to the requirement, and more BUGs need to be found through fixed node automated test equipment. [0003] The current market is mainly to improve the test coverage to increase the amount of BUG discovery, increase the amount of scripts and tests, the manpower, material, and financial resources are consumed, the cluster deployment cost is high, the software automation rate is difficult to improve, and ...

AI Technical Summary

Problems solved by technology

[0003] In the current market, the method of improving the test coverage rate is mainly used to increase the amount of BUG discovery, increase the amount of scripts and tests, consume a lot of manpower, material resources, and financial resources, the cost of cluster deployment is high, it is difficult to improve the software automation rate, and the hardware automation equipment is expensive, etc.

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