A method for improving luminescence performance by self-ion implantation of Si into silicon-based materials
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- YUNNAN UNIV
- Publication Date
- 2019-10-25
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for improving luminous performance by implanting Si ions into silicon-based materials, and belongs to the field of preparation of silicon-based luminescent materials. Background technique
[0002] Due to its indirect bandgap properties, the radiative recombination luminescence of silicon-based materials usually needs to be assisted by phonons, which has caused it to stagnate in the field of optoelectronic integration. At present, in order to improve the luminescent properties of silicon-based materials, the way of modifying their luminescence by defect engineering has become a major focus of research in the field of materials science. Defect engineering is represented by ion implantation. Defects are introduced into crystal Si through ion implantation. Different types of defects and clusters can form impurity (or defect) sub-levels with different positions and widths in the forbidden band, so that the electrons in the ...