Double-reflection type flight time mass spectrometric photoelectron velocity imaging instrument
A time-of-flight mass spectrometry and velocity imaging technology, which is applied in the field of imagers, can solve problems such as the difficulty of energy spectrum detection, the loss of ions reaching the photodesorption region, and the reduced sensitivity of photoelectron velocity imaging.
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[0028] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0029] like Figure 1~5 As shown, the embodiment of the present invention is provided with a laser sputtering ion source 1, a cooling ion trap 2, a time-of-flight mass spectrometer 3 and an anion photoelectron velocity imaging system 4; the laser sputtering ion source 1 is used to generate cluster ions, and the clusters produced The ions enter the cooling ion trap 2 and are imprisoned and cooled, and then vertically accelerated by the acceleration field into the time-of-flight mass spectrometer 3. The intensity distribution of the cluster ions generated is obtained through mass spectrometry detection; after mass spectrometry, the specific cluster negative ions of interest are selected and desorbed The laser interacts to generate neutral molecules and photoelectrons; finally, an anion photoelectron velocity imaging system 4 is used to detect outgoing photoelec...
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