Microscopic examination method used for crystalline silicon photovoltaic module

Abstract

The invention discloses a microscopic examination method used for a crystalline silicon photovoltaic module. The microscopic examination method comprises the following steps of putting the photovoltaic module on a microscopic examination table, turning on an LED searchlight to be aligned to a backboard of the photovoltaic module, and performing examination on the backboard and then on an EVA adhesive film; next, performing examination on an EPE bus bar, enabling the LED searchlight to be aligned to the front surface of the photovoltaic module, and performing examination operation through the mirror surface of the microscopic examination table; and performing examination on a bar code, then on a solder strip bus bar and finally on a battery piece, and after the product is qualified, conveying the product to the next working procedure. The microscopic examination method has reasonable and clear operation steps, can perform effective and quick detection on each part of the photovoltaic module and can solve the quality problem on the surface of the photovoltaic module in time; and the detection method is simple, less in adopted tools and equipment, high in detection efficiency, low incost, and capable of judging qualification of products based on certain standard, so that a series of loss caused by flowing of unqualified products to the market can be avoided, and high use and popularization values are achieved.

Description

technical field [0001] The invention belongs to the field of photovoltaic module processing, and specifically relates to a detection method, more specifically, a microscope inspection method for crystalline silicon photovoltaic modules. Background technique [0002] Photovoltaic modules (also called solar panels) are the core part of the solar power generation system, and also the most important part of the solar power generation system. [0003] After the photovoltaic module is stacked, it needs to be inspected before it can be framed into a finished product. The surface of the photovoltaic module needs to be inspected to judge the surface quality of the photovoltaic module based on the surface condition of the photovoltaic module, so as to ensure the performance of the photovoltaic module. [0004] At present, there is no certain process standard and systematic detection method for the surface detection of photovoltaic modules. It is usually completed by human eyes. During...

AI Technical Summary

Problems solved by technology

[0005] In order to overcome the above-mentioned technical defects, the purpose of the present invention is to provide a microscope inspection method for crystalline silicon photovoltaic modules. The present invention detects the front and back of photovoltaic modules, and the detection operation steps are reasonable and clear, and are measured by vernier calipers. Data to judge the qualification of the product, strictly control the quality of the product, and solve the problem of low detection efficiency of photovoltaic modules