High-altitude satellite power control device accelerated life test system and method

Abstract

The invention discloses a high-altitude satellite power control device accelerated life test system and method. The system comprises a high-temperature test chamber, a power control device, a solar battery array simulator, a storage battery pack simulator, an electronic load and a test process control computer, wherein the high-temperature test chamber is used for providing high-temperature environment required by a test; the power control device is put in the high-temperature test chamber, and is used for adjusting input current of the solar batter array simulator according to power requirement of the electronic load, and managing the charging/discharging of the storage battery pack simulator; the solar battery array simulator is used for simulating input power of a solar battery array ina light period; the storage battery pack simulator is used for realizing charging and discharging functions of a storage battery pack in an earth shadow period; and the electronic load is used for simulating on-satellite electricity loads. The method comprises the following steps of: 1) establishing an acceleration model; 2) carrying out electric performance test before acceleration; 3) carryingout a high-temperature life test; 4) carrying out electric performance test after the acceleration; and 5) analyzing the test result.

Description

technical field [0001] The invention relates to an accelerated life test system and method for a high-orbit satellite power supply control device. Background technique [0002] The power control device is the core stand-alone unit of the satellite power supply and distribution subsystem, which undertakes the important task of providing stable energy for the entire satellite. The working life of power control devices directly restricts the success or failure of satellite missions, so long-lived satellites have a strong demand for life evaluation of power control devices. At present, three methods are mainly used in the life evaluation of power control devices. The first is the simulation analysis method. Based on the circuit principle of the power control device, a complete equivalent circuit simulation model is established, and the worst-case simulation analysis of the power control device is carried out based on the simulation model. The key components of the power control...

AI Technical Summary

Problems solved by technology

The power control device is a complex stand-alone product. It is difficult to achieve a high degree of consistency between the model and the product during simulation modeling. In actual simulation work, it is difficult to obtain accurate quantitative indicators for the difference between the simulation results and the real product status. It is extremely difficult to verify the accuracy;

[0004] 2) The conventional thermal test method can only verify the heat resistance of the power control device at the beginning of its life, and lacks the theoretical basis for estimating the performance at the end of life from the performance at the beginning of life, so it is impossible to directly evaluate the life of the power control device

[0005] 3) The test object of the accelerated life test method for key components is components, and the evaluation object is a stand-alone product, so it can only independently verify the life index of a single component, but cannot verify the subtle performance of a single component during the test Whether the change will affect the performance indicators of the entire power control device cannot verify the working performance of the entire stand-alone product at the end of its life, so the accelerated life test method for key components cannot directly give a conclusion on whether the stand-alone can meet the life requirements

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