Temperature-variable test system

Abstract

The invention belongs to the integrated test system field and discloses a temperature-variable test system. The system comprises a first shell, a background assembly disposed in the first shell, a second shell and a test assembly disposed in the second shell; the first end of the first shell is hermetically connected with the first end of the second shell; the test surface of the test assembly isopposite to the radiation emitting surface of the background assembly; the first shell or the second shell is provided with a vacuum interface; and the background assembly is used for providing background radiation for the test assembly. With the temperature-variable test system of the invention adopted, the integration of the background assembly and the test assembly is realized, so that lower background temperature, working temperature and vacuum degree can be realized, and therefore, the accuracy of a chip test and the anti-jamming capability of the system can be ensured.

Description

technical field [0001] The invention belongs to the field of integrated test systems, and more specifically relates to a temperature-variable test system. Background technique [0002] Infrared detectors are the most important photoelectric conversion front-end products in infrared application systems, and are also the core components of infrared weapons and equipment. Its main applications in the field of national defense and military include night vision equipment, surrounding search, thermal image sighting, and forward-looking early warning. , weapon guidance, air defense surveillance and infrared identification, etc. The Dewar package of the infrared cooling detector provides the imaging optical system, detector, electronic signal processing, mechanical installation and connection reference of the refrigerator, protects the detector and realizes electrical connection, maintains the vacuum insulation required for the cryogenic operation of the refrigerator, and ensures th...

AI Technical Summary

Problems solved by technology

[0004] 1. The chamber of the test system is large and poorly airtight, and the vacuum degree can only reach 10 after being vacuumed by the vacuum pump group. -2 Pa, but can not reach ultra-high vacuum;

[0005] 2. This type of test system is refrigerated by liquid nitrogen refrigeration, and the background temperature can only reach about minus 190°C (ie 80K). If it is to be lower than the temperature of liquid nitrogen, it is difficult for this type of equipment itself to achieve;

[0006] 3. The test system uses liquid nitrogen refrigeration. Due to the large chamber and the vacuum holding time is not long enough, more liquid nitrogen is needed to maintain the low temperature. After the test is completed, the liquid nitrogen will be volatilized into nitrogen and consumed, resulting in a higher test cost;

[0007] 4. The system is bulky, not easy to operate, and it is not very convenient to install and debug

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