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A kind of silicon-doped boron nitride/graphene pn junction type ultraviolet detector preparation method

An ultraviolet detector, boron nitride technology, applied in semiconductor devices, final product manufacturing, sustainable manufacturing/processing, etc., can solve the problems of complex doping technology, complex structural design, lack of deep ultraviolet detectors, etc. Carrier mobility, effective absorption, and controllable technical processes

Active Publication Date: 2019-12-27
SHANDONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] In view of the lack of deep ultraviolet detectors based on boron nitride, complicated doping technology, and complicated structural design in the above-mentioned prior art, the purpose of the present invention is to provide ultraviolet detectors and The preparation method, through simple structural design, uses graphene material with low lattice mismatch with boron nitride to construct a heterojunction, and prepares a PN junction type ultraviolet detector. High-precision ultraviolet light source system and other fields have huge technical advantages and application space

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  • A kind of silicon-doped boron nitride/graphene pn junction type ultraviolet detector preparation method
  • A kind of silicon-doped boron nitride/graphene pn junction type ultraviolet detector preparation method
  • A kind of silicon-doped boron nitride/graphene pn junction type ultraviolet detector preparation method

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Effect test

Embodiment 1

[0050] In step 1), use acetone, absolute ethanol, and deionized water to ultrasonically wash the quartz glass substrate 5 times, each time for 10 minutes, and then dry it with a nitrogen gun for use. Then magnetron sputtering technology was used to pre-sputter and deposit a certain thickness of boron nitride thin layer. The target material was hexagonal boron nitride target (purity: 99.9), the sputtering power was 80W, the substrate temperature was 500°C, and the pressure was 1Pa, Ar:N 2 The volume ratio is 3:1. Gas flow Ar gas flow is 15sccm, N 2 is 5 sccm. The purpose of pre-sputtering the thickness of the thin layer is to reduce the lattice mismatch between the epitaxial layer and the substrate, and use the thin layer to relieve the generation of stress and the generation of smaller defects and dislocations.

[0051] Step 2), on the basis of the boron nitride thin layer, silicon-doped boron nitride is deposited by sputtering. Double-target co-sputtering technology is ad...

Embodiment 2

[0057] In step 1), use acetone, absolute ethanol, and deionized water to ultrasonically wash the quartz glass substrate 5 times, each time for 10 minutes, and then dry it with a nitrogen gun for use. Then magnetron sputtering technology was used to pre-sputter and deposit a certain thickness of boron nitride thin layer. The target material was hexagonal boron nitride target (purity: 99.9), the sputtering power was 80W, the substrate temperature was 500°C, and the pressure was 1Pa, Ar:N 2 The volume ratio is 3:1. Gas flow Ar gas flow is 15sccm, N 2 is 5 sccm. The purpose of pre-sputtering the thickness of the thin layer is to reduce the lattice mismatch between the epitaxial layer and the substrate, and use the thin layer to relieve the generation of stress and the generation of smaller defects and dislocations.

[0058] Step 2), on the basis of the boron nitride thin layer, silicon-doped boron nitride is deposited by sputtering. Double-target co-sputtering technology is ad...

Embodiment 3

[0063]In step 1), use acetone, absolute ethanol, and deionized water to ultrasonically wash the quartz glass substrate 5 times, each time for 10 minutes, and then dry it with a nitrogen gun for use. Then magnetron sputtering technology was used to pre-sputter and deposit a certain thickness of boron nitride thin layer. The target material was hexagonal boron nitride target (purity: 99.9), the sputtering power was 80W, the substrate temperature was 500°C, and the pressure was 1Pa, Ar:N 2 The volume ratio is 3:1. Gas flow Ar gas flow is 15sccm, N 2 is 5 sccm. The purpose of pre-sputtering the thickness of the thin layer is to reduce the lattice mismatch between the epitaxial layer and the substrate, and use the thin layer to relieve the generation of stress and the generation of smaller defects and dislocations.

[0064] Step 2), on the basis of the boron nitride thin layer, silicon-doped boron nitride is deposited by sputtering. Double-target co-sputtering technology is ado...

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Abstract

The invention discloses a PN-junction ultraviolet detector constructed by silicon-doped boron nitride and graphene and a preparation method thereof. The PN-junction ultraviolet detector comprises a silicon-doped boron nitride nano-particle layer and a graphene layer. The silicon-doped boron nitride nano-particle layer is used as an ultraviolet absorbing layer. A heterojunction is formed between the silicon-doped boron nitride nano-particle layer and the graphene layer.The silicon-doped boron nitride in the silicon-doped boron nitride nano-particle layer is an n-type semiconductor boron nitridematerial formed by doping boron nitride with elementary substance of silicon. The boron nitride material is doped with silicon to form an n-type semiconductor boron nitride material, and is combinedwith the intrinsic p-type characteristics of the graphene to form the PN-junction ultraviolet detector. The structure is simple in design, can fully exert the intrinsic ultraviolet absorption characteristics of the boron nitride material, and utilizes the extremely high carrier mobility of the grapheme to effectively improve device speed.

Description

technical field [0001] The invention relates to the technical field of semiconductor optoelectronic devices, in particular to a PN junction ultraviolet detector constructed of a silicon-doped boron nitride nanoparticle film and graphene and a preparation method thereof. Background technique [0002] With the development of semiconductor technology, the performance of silicon-based semiconductor devices is approaching the theoretical limit. In the actual military and civilian fields, higher requirements are put forward for the application of semiconductor devices. For example, higher operating temperature, frequency, power, chemical stability, high pressure resistance, corrosion resistance, visible light transmittance and other characteristics, but the current silicon-based devices have been difficult to meet these requirements. Boron nitride is a wide-bandgap semiconductor material with low carrier concentration, high resistivity, high thermal conductivity and high chemical...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/109H01L31/028H01L31/0304H01L31/18
CPCH01L31/028H01L31/03044H01L31/109H01L31/1876Y02P70/50
Inventor 慈立杰彭瑞芹王旭天张琳
Owner SHANDONG UNIV