Supercharge Your Innovation With Domain-Expert AI Agents!

A board-level package design optimization method for integrated qfn chips

An optimization method, integrated circuit board technology, applied in design optimization/simulation, computer-aided design, CAD circuit design, etc., to achieve the effects of low processing cost and process difficulty, improved efficiency and convergence, and good engineering practicability

Active Publication Date: 2022-04-12
HUNAN CITY UNIV
View PDF13 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

First of all, building an effective optimization model not only needs to comprehensively consider the electrical properties, thermal properties and mechanical properties of the integrated circuit board, but also needs to take into account the manufacturing cost and process difficulty, which is very challenging for ordinary technicians

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A board-level package design optimization method for integrated qfn chips
  • A board-level package design optimization method for integrated qfn chips
  • A board-level package design optimization method for integrated qfn chips

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0034] refer to figure 1 As shown, the present invention relates to a board-level packaging design optimization method for integrated QFN chips, and the steps are as follows.

[0035] 1) Step 1, determine the parameters of the integrated circuit board and establish a thermal-mechanical coupling simulation model

[0036] refer to figure 2 As shown, according to the existing information, determine the parameters of the integrated circuit board, including: substrate 01, QFN chip parts 02~06 and device 07~10 structural dimensions, plane coordinates, elastic modulus, Poisson's ratio, thermal expansion coefficient, Working heat consumption, as well as the plane coordinates of fixed points 11~12, and the working temperature range of the integrated circuit board [-20°C, 60°C]; the specific information is listed in Table 1 and Table 2. According to the abov...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a board-level packaging design optimization method for integrated QFN chips, the steps include: determining the parameters of the integrated circuit board and establishing a thermal coupling simulation model; constructing the performance function of the thermal stress of the pad and the warpage of the chip; constructing the thermal stress of the pad Limit state equations of stress and wafer warpage; construct approximate limit state equations of pad thermal stress and wafer warpage; check pad strength and wafer warpage; end and output the optimal design of board-level packaging and the optimal error of fixed points tolerance. The present invention builds a thermal-mechanical coupling simulation model for the board-level packaging of the integrated QFN chip, and uses interval analysis technology to establish the limit state equation. The optimal design scheme of the obtained board-level packaging can not only meet the design requirements of thermal stress and warpage, but also has The lowest processing cost and process difficulty. Moreover, the method proposed in the present invention has good comprehensive performance in terms of efficiency and convergence.

Description

technical field [0001] The invention belongs to the field of integrated circuit packaging design, and in particular relates to a board-level packaging design optimization method for integrated QFN chips. Background technique [0002] Packaging can not only provide the necessary electrical connection between integrated circuits and external systems, but also provide mechanical or environmental protection for integrated circuits. With the rapid development of microelectronics technology, high-level packaging design has become a challenging task. Packaging can generally be defined into four levels: wafer level, chip level, board level and system level. Board-level packaging refers to the joint installation of chips and passive components on a printed circuit board to form an integrated circuit board with specific functions. Board-level packaging needs to provide a stable and reliable working environment for the integrated chip; therefore, the packaging characteristics of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/398
CPCG06F2113/18G06F30/39G06F30/20
Inventor 黄志亮曾琦曾宪辰阳同光李航洋赵治国
Owner HUNAN CITY UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More