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Langmuir probe, Langmuir probe diagnosis system and diagnosis method thereof

A technology of Langmuir probe and diagnostic method, applied in electrical components, plasma, etc., can solve problems such as reducing measurement accuracy

Inactive Publication Date: 2018-10-23
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] When using the Langmuir probe, due to the influence of the expansion of the space sheath, the actual collection area of ​​the Langmuir probe is larger than the surface area of ​​the probe, which reduces the measurement accuracy

Method used

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  • Langmuir probe, Langmuir probe diagnosis system and diagnosis method thereof
  • Langmuir probe, Langmuir probe diagnosis system and diagnosis method thereof
  • Langmuir probe, Langmuir probe diagnosis system and diagnosis method thereof

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Embodiment

[0049] According to one aspect of the present invention, there is provided a Langmuir probe, such as figure 1 as well as figure 2 As shown, it includes a collector 101, a conductive screw lead 102, a ceramic sheath 103 and a nut 104; the collector 101 includes a cylindrical first sub-collector 1011 and a cylindrical second sub-collector 1012;

[0050] The diameter of the first sub-collector 1011 is greater than the diameter of the second sub-collector 1012, and the first sub-collector 1011 and the second sub-collector 1012 are concentric structures, and the first sub-collector 1011 and the second sub-collector 1012 are integrated forming;

[0051] The conductive screw leads 102 are screwed into the second sub-collector 1012 to connect with the second sub-collector 1012, and the ceramic sheath 103 is in the shape of a boss, and is sleeved on the side of the first sub-collector 1011 and the second sub-collector 1012 and interference fit with the first sub-collector 1011 and t...

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Abstract

The invention discloses a Langmuir probe, a Langmuir probe diagnosis system and a diagnosis method thereof, which relate to the technical field of plasmas. The Langmuir probe comprises a collector, aconductive screw lead, a ceramic sheath and a nut, wherein the collector comprises a first cylindrical sub collector and a second cylindrical sub collector; the diameter of the first sub collector islarger than that of the second sub collector, the first sub collector and the second sub collector have a concentric structure, and the first sub collector and the second sub collector are integrallyformed; the conductive screw lead is screwed to the second sub collector to be connected with the second sub collector; the ceramic sheath is boss-shaped and sleeves the side surface of the first subcollector and the side surface of the second sub collector and is in interference fit with the first sub collector and the second sub collector; and a hexagon nut is in screw joint with the conductivescrew lead and is in butt joint with the ceramic sheath. The Langmuir probe can prevent the side surface of the probe from gathering particles, the probe gathering area is reduced, and the measurement precision is improved.

Description

technical field [0001] The invention relates to the technical field of medical equipment, in particular to a Langmuir probe, a Langmuir probe diagnostic system and a diagnostic method thereof. Background technique [0002] Electric thrusters such as ion thrusters and Hall thrusters are widely used in spacecraft attitude and orbit control because of their advantages such as high specific impulse, long life and small system mass. Accurately obtaining the parameters of the electric thruster vacuum plume is crucial for evaluating the performance of the electric thruster and spacecraft; the vacuum plume of the electric thruster is plasma, and the electron temperature and electron number density are the basic parameters of the plasma plume flow field. Obtaining electron temperature and electron number density is an important prerequisite for studying plasma properties, and Langmuir probes are usually used to diagnose the electron temperature and electron number density of the isoe...

Claims

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Application Information

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IPC IPC(8): H05H1/00
CPCH05H1/0075
Inventor 蔡国飙韩木天凌贵龙翁惠焱贺碧蛟
Owner BEIHANG UNIV
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