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A method for precise measurement of laser wavelength

A technology of precise measurement and laser wavelength, applied in optical radiation measurement, measurement device, measurement optics, etc., to simplify the measurement system structure, avoid mechanical disturbance and environmental disturbance, and achieve the effect of mass manufacturing

Active Publication Date: 2019-12-20
XI AN JIAOTONG UNIV
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Problems solved by technology

[0004] The above-mentioned technical problems are the main difficulties faced in the precision measurement of laser wavelength at present.

Method used

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  • A method for precise measurement of laser wavelength
  • A method for precise measurement of laser wavelength
  • A method for precise measurement of laser wavelength

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Embodiment Construction

[0024] The implementation of the present invention will be described in detail below in conjunction with the drawings and examples.

[0025] figure 1 The working principle of the device shown: continuous wave laser 1 emits a laser beam, which is focused by a Fresnel zone plate 2 with a large numerical aperture, and then the on-axis light is filtered by a pinhole 3, and the light field passing through the pinhole 3 is detected by a photodetector 4 for intensity detection, the pinhole 3 and the photodetector 4 form a point detector, use the one-dimensional piezoelectric ceramic nanometer displacement table 5 to uniformly step and scan the point detector along the axis, measure the focused axial intensity point spread function, use the centroid The focal length is determined by the method, and the linear measurement curve is obtained by using the linear least square fitting method through the focal length-wavelength correspondence relationship, and the precise measurement of the ...

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Abstract

The invention discloses a precise laser wavelength measurement method, which belongs to the technical field of optical precise measurement. A Fresnel zone plate (FZP) with a large numerical aperture is used, a vectorial angular spectrum theory is adopted to calculate a corresponding axial intensity point spreading function when linearly polarized light with an illumination wavelength to be lambdaivertically illuminates on the FZP, a focal length zp is obtained according to a peak value, the lambdai is changed for recalculation to obtain a focal length zp, a linear correlation coefficient is used to evaluate correlation of (lambdai, zp), a linear interval is intercepted, a linear least square fitting method is used to obtain a linear measurement curve, the FZP is used to directly focus a to-be-measured laser beam, a point detector is scanned in an axial stepping mode through a piezoelectric ceramic nano displacement table, the distribution of the axial intensity point spreading function is measured, a centroid method is used to obtain an actual focal length, and the linear measurement curve is used to solve the laser wavelength. The method is simple, the cost is low, the wavelengthmeasurement application range is wide, and the method is applicable to low-cost precise laser wavelength measurement.

Description

technical field [0001] The invention belongs to the technical field of optical precision measurement, in particular to a laser wavelength precision measurement method. Background technique [0002] Light wave radiation is related to the structure and composition of matter, so the measurement of light wavelength is the basis for material analysis, and the precise measurement of laser wavelength is the primary problem of using lasers. At present, the measurement of laser wavelength mainly relies on the principle of light interference and diffraction. Methods based on interference principles include Young’s double-slit interferometer, Michelson interferometer, and Fabry-Perot interferometer. The system and principle of double-slit interferometry wavelength measurement are simple, but the accuracy and resolution of wavelength measurement are low. Michael The wavelength measurement accuracy and spectral resolution of the Johnson interferometer and the Fabry-Perot interferometer ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/02
CPCG01J9/0246
Inventor 刘涛刘强杨树明刘康王一鸣田博蒋庄德
Owner XI AN JIAOTONG UNIV
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