Novel automated testing system and method

Abstract

The invention discloses a novel automated testing system and method and relates to automated testing in the field of digital communication and computer software. The system is connected with tested equipment and comprises a multi-project management module, a master control module and a synchronous cross module which are connected sequentially and also comprises a discriminative information processing module, a configuration information processing module and a self-monitoring processing module which are connected with the synchronous cross module; the discriminative information processing module is connected with a discriminative information library, the configuration information processing module is connected with a configuration information library, the self-monitoring processing module is connected with a self-monitoring information library, and the discriminative information library, the configuration information library and the self-monitoring information library are all connectedwith the tested equipment; the master control module is connected with a monitoring module and a man-machine interface module; aiming at current test cases, the synchronous cross module completes synchronous processing among the discriminative information processing module, the configuration information processing module and the self-monitoring processing module. The novel automated testing systemhas a third-party testing switching capability, improves the fault positioning capability, realizes resource sharing and saves development time cost of projects.

Description

technical field [0001] The invention relates to automatic testing in the field of digital communication and computer software, specifically a novel automatic testing system and method. Background technique [0002] The chip design of the integrated circuit needs to do prototype verification before the chip is put into the chip, and the sample function verification needs to be done after the chip sample comes back. The ultimate goal is to push the chip to the market as soon as possible. The test case library for chips with complex functions is very large. If it is completely tested manually, the workload will be very large. Therefore, people adopt automated regression testing methods to improve test efficiency. After consulting, existing automated testing technologies such as "A Reproducible Automatic Testing Method" of Chinese Patent CN200510032851.5, "Method and System for Automatic Software Testing" of CN201110168160.3, etc., all have the following problems: [0003] 1) E...

AI Technical Summary

Problems solved by technology

[0003] 1) Existing automated test solutions are generally based on the same set of tests and do not have the ability to switch to third-party tests

[0004] 2) Generally, through log records, the case of failure is debugged separately, and the ability of safe fault location is relatively low

[0005] 3) Existing automated testing is generally carried out for a specific project, and the ability to share resources is insufficient, which affects the progress of project development

Images