A test method and test system for a full model of a standard cell library
A standard cell library and standard cell technology, which is applied in the fields of instruments, computing, and electrical digital data processing, etc., can solve problems such as chip tape-out failure, inability to guarantee model data consistency, and inability to guarantee the electrical characteristics of the standard cell library. The effect of coverage
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[0067] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0068] In an exemplary embodiment of the present invention, a method for testing a full model of a standard cell library is provided. figure 2 It is a schematic flowchart of a testing method for a full model of a standard cell library in an embodiment of the present invention. Such as figure 2 As shown, the testing method of the standard cell library full model of the present invention comprises the following steps:
[0069] Step 201 , check the multiple physical rules of the standard cell layout to verify the correctness of the standard cell physical design rules.
[0070] This step includes the following substeps:
[0071] A1. Perform random splicing inspection of standard cells: splice all standard cells together ...
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