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Sensitive equipment voltage sag tolerance characteristic testing and data processing method

A technology for voltage sag and characteristic testing, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc. It can solve the problems of experimental testing, difficulty in obtaining quantitative results of equipment sag tolerance, and inability to reflect the degree of influence of sensitive equipment.

Active Publication Date: 2018-11-30
NORTH CHINA ELECTRIC POWER UNIV (BAODING) +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the inability to carry out experimental tests for each device, the problem of quantitative description of the uncertain region of the sag tolerance capability of typical sensitive devices arises
At present, relevant researchers have proposed the normal distribution probability density function method, fuzzy random method, interval method, etc., but all of them are suitable for the rectangular plane of equipment sag tolerance, and cannot reflect the impact of voltage sag events on sensitive equipment. the actual degree of influence
However, through the sag tolerance test of sensitive equipment, it is found that the sag tolerance characteristics of some typical sensitive equipment have changed, and the resulting uncertain area is non-rectangular, such as the current PLC, AC contactor, etc.
The equipment failure probability assessment model established for the rectangular uncertain region may be difficult to obtain quantitative results that conform to the actual sag tolerance capability of the equipment

Method used

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  • Sensitive equipment voltage sag tolerance characteristic testing and data processing method
  • Sensitive equipment voltage sag tolerance characteristic testing and data processing method
  • Sensitive equipment voltage sag tolerance characteristic testing and data processing method

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Embodiment Construction

[0053] The present invention will be described in detail below with reference to the accompanying drawings.

[0054] The detailed reasoning analysis method and demonstration analysis examples are disclosed below. However, the specific reasoning and analysis process details disclosed herein are only for the purpose of describing exemplary analysis examples.

[0055] However, it should be understood that the present invention is not limited to the disclosed specific exemplary embodiments, but covers all modifications, equivalents, and alternatives falling within the scope of the present disclosure. In the description of all the drawings, the same reference numerals denote the same elements.

[0056] Such as figure 1 As shown, a voltage sag withstand characteristic test and data processing method for sensitive equipment includes the following steps:

[0057] A. Set the sag test point by changing the duration step by step;

[0058] B. Envelope and broken line treatment of equipment tolera...

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Abstract

The invention discloses a sensitive equipment voltage sag tolerance characteristic testing and data processing method. The method comprises the following steps: setting duration time of the sag in variable-step by section, adding the density of testing points at a transition part of a tolerance curve so as to guarantee that the obtained tolerance curve is more precise, and guarantee that the testing frequency is within a reasonable range; testing under various influence elements to obtain a large amount of tolerance curves, and performing enveloping processing, and performing line broken processing on the enveloped line; dividing a non-rectangular uncertain region of the equipment into two regions, describing the rectangular region therein according to uniform distribution by taking the determination probability values of the upper enveloping line and the lower enveloping line and the region boundary line as the reference values, and quantizing the influence degree on the equipment bythe voltage sag event by adopting a line section specific method between related points for the non-rectangular region. The method disclosed by the invention can provide a reasonable testing method and a simple data processing method for the users of power grids, governance vendors, and sensitive equipment, thereby realizing the quantitative description of the non-rectangular uncertain region of the equipment.

Description

Technical field [0001] The invention belongs to the technical field of power quality analysis, and particularly relates to a test and data processing method for voltage sag tolerance characteristics of sensitive equipment. Background technique [0002] In recent years, power supply companies and power users have paid more and more attention to the problem of voltage sag events affecting the normal operation of typical equipment, and have carried out a lot of monitoring, evaluation and management work. Typical equipment commonly found in modern industries, such as AC contactors, frequency converters, programmable logic controllers (PLCs), PCs, etc., are sensitive to voltage sag events, and their impact may lead to shutdown, control command disorder, Decrease in efficiency or shortened life span, etc., causing serious losses. For example, the operating status of the PC depends on the severity of the sag event, operating conditions, power supply structure, software and hardware con...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 徐永海及洪泉迟忠君常乾坤钱叶牛贾东强王海云吴亚盆李晨懿
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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