Parallel multi-channel optical module test device applied to 40Gbs, 100Gbs and 120Gbs
An optical module testing and testing device technology, applied in electromagnetic wave transmission systems, electrical components, transmission systems, etc., can solve the problems of inability to find hardware testing devices, complex system construction, and huge testing systems, achieving flexible assembly, reduced size, cost reduction effect
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Embodiment 1
[0026] Embodiment 1 of the present invention provides a parallel multi-channel optical module testing device for 40Gbs, 100Gbs, and 120Gbs, including a main control unit, a motherboard, a TX (transmitting) daughter board, an RX (receiving end) daughter Switch, optical switch, photoelectric eye diagram instrument, among them, the mother board, TX daughter board, and RX daughter board are separated, which is convenient for flexible matching when testing different indicators; mother board, TX daughter board, RX daughter board, multi-channel electrical switch , optical switch, and photoelectric eye diagram are all connected to the main control unit.
[0027] The motherboard provides power to the TX sub-board and RX sub-board, generates a clock signal with continuously adjustable frequency, provides a modulation signal, and detects the bit error rate of the received signal. The motherboard itself can be equivalent to a signal generator analyzer.
[0028] The TX sub-board can simult...
Embodiment 2
[0032] As a preferred embodiment, on the basis of Example 1, see figure 1 As shown, the motherboard includes a first clock reference source 1, a signal generation and processing chip, a first MCU processor 1, a standard light source, a power supply unit, a first communication interface 1, a first communication and power interface 1, three SMA (Sub-Miniature-A, antenna interface) high-frequency connectors: SMA1, SMA2, SMA3.
[0033] The first clock reference source 1 adopts SI5326 of Silicon Company, and under the control of the main control unit (delivering different register values), it can output a low-jitter clock signal with continuously adjustable frequency.
[0034] According to the service type, the frequency range of the clock signal output by the first clock reference source is 155.4MHz to 176.8MHz. The TX sub-board and the photoelectric eye diagram instrument provide the same source clock; the other differential clock signal provides the reference clock for the sign...
Embodiment 3
[0038] As a preferred embodiment, on the basis of Example 2, see figure 2 As shown, the TX daughter board includes a second clock reference source 2, a clock distribution unit, 6 signal generation and processing chips, a second MCU processor 2, a second communication interface 2, a second communication and power interface 2, a Selector switch (manual code dial), two SMA high-frequency connectors: SMA4, SMA5.
[0039] The second clock reference source 2 (SI5326) connects one signal to a high-frequency connector SMA4, and the other signal to the clock distribution unit.
[0040] The clock distribution unit adopts MC100 series low-jitter Buffer (buffer), which supports 2-way clock input and 10-way differential signal output. 2-way clock input One is from the second clock reference source 2 of the TX sub-board, and the other is connected to SMA5, using the external clock source as the input, and which one is selected by the selection switch. 6 of the 10 differential signals are...
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