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A device and method for measuring the normal emissivity of opaque solid materials based on solar simulator heating

A technology of normal emissivity and solar energy simulation, which is applied in the field of normal emissivity measurement devices and can solve problems such as poor accuracy

Active Publication Date: 2021-07-06
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the problem of poor accuracy of the existing high-temperature normal emissivity measurement method of opaque solid materials, the present invention proposes an opaque solid material normal emissivity measurement device and measurement method based on solar simulator heating

Method used

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  • A device and method for measuring the normal emissivity of opaque solid materials based on solar simulator heating
  • A device and method for measuring the normal emissivity of opaque solid materials based on solar simulator heating
  • A device and method for measuring the normal emissivity of opaque solid materials based on solar simulator heating

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specific Embodiment approach 1

[0044] Specific implementation mode 1: This implementation mode is based on the normal emissivity measurement device of opaque solid material heated by a solar simulator

[0045] It consists of a solar simulator 1, a glass screen 2, a high-temperature sample holder 3, a thermocouple 5, a slide rail 7, an infrared thermal imager 8, a parabolic mirror 9, a Fourier infrared spectrometer 10, a blackbody furnace 11, a mirror base 12, The sample exit surface shielding device 21 and the thermal imager base 13 are composed;

[0046] The sample exit surface blocking device 21 is composed of a front baffle 17, a rear baffle 16 and a double-track slideway 18; A cooling water inlet pipe and a cooling water outlet pipe communicating with the cavity are provided; the rear baffle 16 is plate-shaped, the middle part of the rear baffle 16 is a cavity, and the side of the rear baffle 16 is provided with a cooling water inlet communicating with the cavity. Water pipes and cooling water outlet p...

specific Embodiment approach 2

[0054] Embodiment 2: This embodiment differs from Embodiment 1 in that: the glass screen 2 is a plate-shaped hollow quartz glass, and the sides of the glass screen 2 are provided with cooling water inlet pipes and cooling water outlet pipes. Other steps and parameters are the same as those in the first embodiment.

specific Embodiment approach 3

[0055] Embodiment 3: This embodiment differs from Embodiment 1 or Embodiment 2 in that: a heat insulating material is provided between the annular inner surface of the high-temperature sample holder 3 and the sample. Other steps and parameters are the same as those in Embodiment 1 or 2.

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Abstract

A device and method for measuring normal emissivity of opaque solid materials based on solar simulator heating, relating to a device and method for measuring normal emissivity. The purpose is to solve the problem of poor accuracy of the high-temperature normal emissivity measurement method of opaque solid materials. The invention directly heats the sample through the solar simulator, which avoids the interference of the measurement signal caused by multiple reflections caused by the optical window in the conventional high-temperature measurement optical path, and the infrared thermal imager ensures that the temperature of the sample to be tested is uniform; before measuring the emission spectrum, the background The spectrum is measured, and the background spectrum is subtracted from the emission spectrum in the calculation to remove the interference of the background signal. Through the measurement of the calibration coefficient, the measurement deviation that may exist between the measurement optical paths is eliminated. The set glass screen can reduce the stray radiation of the light source. The invention can accurately calculate the high-temperature normal emissivity of opaque solid materials. The invention is applicable to the high-temperature normal emissivity measurement of opaque solid materials.

Description

technical field [0001] The invention relates to a normal emissivity measuring device and a measuring method. Background technique [0002] With the development of the aerospace field, the high-temperature application of metal materials and heat-proof materials has received more and more attention. Since radiation heat transfer is dominant under high temperature conditions, the study of emission characteristics of opaque solid materials at high temperature is of great significance to the fields of thermal radiation transfer and material performance optimization. Therefore, it is imminent to carry out research on high temperature normal emissivity measurement methods for opaque solid materials. . [0003] However, in the researches that have been carried out so far, the closed high-temperature furnace heating method needs to be equipped with an optical window, and there will be multiple reflections of the measurement signal in the optical path system composed of the window an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/20
CPCG01N25/20
Inventor 艾青刘梦蔡静夏新林孙创
Owner HARBIN INST OF TECH
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