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High-precision and wide-size particle field measurement method

A measurement method and particle field technology, applied in the direction of measurement devices, particle size analysis, particle and sedimentation analysis, etc., can solve the problems of difficult particle field measurement and simultaneous recording, and achieve good fringe contrast, high brightness, and high measurement The effect of precision

Inactive Publication Date: 2018-12-21
TIANJIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For a wide-sized particle field, on the one hand, for the same scattering angle, it is difficult to record the fringe pattern of large particle size and small particle size at the same time because the scattering light intensity of large particles is stronger than that of small particles
On the other hand, the scattering angle area with better contrast of large particle streaks is not necessarily the same as the scattering angle area with better contrast of small particle streaks. No matter how to design the best experimental system, it is difficult to achieve a wide range of particle field measurements. Simultaneous measurement of particle size in a spray field such as a wide size range

Method used

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  • High-precision and wide-size particle field measurement method

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Embodiment 1

[0029] A high-precision wide-size particle field measurement method, see Figure 1-Figure 4 , the measurement method includes the following steps:

[0030] 1. Build the optical system

[0031] according to figure 1 The optical path system shown is constructed, including: a laser 1 , a beam expander collimator system 2 , a beam compression system 3 , a particle field 4 , an imaging lens 5 , a polarizer 6 , and a CCD 7 .

[0032] Laser 1 is a vertically polarized semiconductor laser with a wavelength of λ=532nm and a maximum power of 1.5W. The thin beam emitted by the laser 1 is expanded, filtered, and collimated by the beam expander and collimator system 2, and then compressed into a sheet-like beam by the beam compression system 3 composed of two cylindrical lenses.

[0033] The imaging lens 5 is a Nikon 50mmf / 1.8D fixed-focus lens, the number of pixels of the CCD 7 is 2448×2048, and the pixel size is 6.45 μm×6.45 μm. The imaging lens 5 collects the scattered light of the ...

Embodiment 2

[0038] according to image 3 The flow chart was simulated, Figure 4 A set of simulation experiment results are given. Figure 4 (a) is the simulation result when the scattering angle is 70° and the scattered light is vertically polarized light, the measurable particle size range is 10 μm-100 μm, Figure 4 (b) is the simulation result when the scattering angle is 85° and the scattered light is parallel polarized light. The measurable particle size range is 30 μm-600 μm. right Figure 4 The system corresponding to (a) is more suitable for the measurement of small particle size particles, and the fringe frequency of the fringe pattern cannot be extracted for particles with a particle size of 200 μm and 250 μm. right Figure 4 The system corresponding to (b) is more suitable for the measurement of large particle size particles, and the fringe frequency cannot be extracted from the fringe pattern with a particle size of 800 μm. combine Figure 4 (a) and Figure 4 (b) Corres...

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Abstract

The invention discloses a high-precision and wide-size particle field measurement method. According to the method, on the basis of IPI systems in dual / multiple angles and different polarization states, out-of-focus fringe patterns generated by particle scattering light are recorded simultaneously, the fringe numbers or fringe frequencies of the fringe patterns acquired at different scattering angle areas are extracted, the particle size is calculated, and the measurable particle size range is the measurable minimum particle size and maximum particle size interval of the dual / multiple systems.The noncontact measurement method has the advantages of being simple in principle, high in measurement precision and practicability and the like and can be used for spray particle field and aerosol particle field measurement.

Description

technical field [0001] The invention relates to the technical field of particle field measurement, in particular to a high-precision wide-size particle field measurement method. Background technique [0002] Particles widely exist in industrial production and scientific research, such as: spray, fluid, petroleum, chemical, environmental protection, materials, water conservancy, food, aerospace, and fuel combustion and other fields. Particle size parameters not only have a direct impact on the performance and quality of materials and products, but also have a direct or indirect relationship with optimizing the process, reducing energy consumption, and reducing environmental pollution. Therefore, particle size measurement and diagnosis are of great significance in the fields of industry and scientific research. A variety of particle size measurement methods based on optical principles have been proposed. Interferometric particle imaging (IPI) is a particle size measurement me...

Claims

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Application Information

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IPC IPC(8): G01N15/02
CPCG01N15/0211
Inventor 吕且妮徐捷尉小雪
Owner TIANJIN UNIV
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