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Optical component high reflectivity measurement system and measurement method

An optical element, high reflectivity technology, applied in the measurement of scattering characteristics, etc., can solve the problems of cumbersome measurement process, low detection sensitivity, poor anti-interference ability of the system, etc., to achieve the effect of fast and convenient installation and strong anti-interference ability

Active Publication Date: 2021-06-01
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] Formula (4) is the calculation formula of the smallest detectable unit of the system [see literature: 7C.J.Wang,"Fiber LoopRingdown-a Time-Domain Sensing Technique for Multi-Function Fiber OpticSensor Platforms:Current Status and Design Perspectives,"Sensors, vol.9, pp.7595-7621, 2009.], where m, is a fixed value, it can be seen that the smallest detectable unit of the system is inversely proportional to the cavity length L. Considering that the resonant cavity of the current common measurement method is composed of cavity mirrors, the cavity length of the resonant cavity is generally about 1 meter, so The minimum detectable unit is large, and the detection sensitivity of the system is low
[0013] (2) Since the resonant cavity is composed of cavity mirrors, and the cavity mirrors need to be precisely adjusted before they can work normally, the measurement process is cumbersome, and the anti-interference ability of the system is poor

Method used

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  • Optical component high reflectivity measurement system and measurement method
  • Optical component high reflectivity measurement system and measurement method
  • Optical component high reflectivity measurement system and measurement method

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Embodiment 1

[0033] In the figure, 1 is a semiconductor laser (U.S. Newport Co., Ltd., LQA1064-150E), 5 is a high-speed photodetector (U.S. Newport Co., Ltd., 125-MHz Photoreceivers Models 1811), 6 is an oscilloscope (U.S. Tektronix Co., Ltd., DPO2022B), 7 is a signal generator (US Tektronix Co., Ltd., AFG3022C), 8 is a sample to be tested (Japan SIGMA KOKI, TFHSM-25.4C06-1064), 9, 11, 12, 14, 18, and 20 are transmission fibers (US Nufern Corporation ), 10 is a fiber optic isolator (U.S. Thorlabs Co., Ltd., IO-F-1050), 13 is a front-end fiber coupler (U.S. Thorlabs Co., Ltd., TN1064R1F2A), and 19 is a back-end fiber optic coupler (U.S. Thorlabs Co., Ltd., TN1064R1F2A) .

[0034] The laser light source is used to provide the measurement light source for the measurement system. The laser beam emitted by the laser source passes through the first optical fiber and then enters the fiber isolator. After the transmission, it enters the first fiber coupler. The output beam of the first fiber coup...

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Abstract

A system and method for measuring high reflectivity of optical components, the system includes a laser light source, a photodetector, an oscilloscope, a signal generator, a first optical fiber, an optical fiber isolator, a second optical fiber, a third optical fiber, a first optical fiber coupler, The fourth optical fiber, the sample stage, the first attitude adjustment mechanism, the second attitude adjustment mechanism, the fifth optical fiber, the second optical fiber coupler and the sixth optical fiber, and the existing commonly used resonant cavity based on high reflection mirrors have high reflectivity Compared with the measurement technology, the measurement sensitivity of the present invention is increased by more than 1000 times, and the measurement system has the characteristics of compact structure, flexible layout, strong anti-interference ability and convenient measurement.

Description

technical field [0001] The invention relates to the field of high reflectivity measurement, in particular to a high reflectivity measurement system and method for an optical element. Background technique [0002] Mirrors with extremely high reflectivity (higher than 99.9%) are widely used in the fields of gravitational wave observation, laser gyroscope, high-power laser, etc. In these systems, the reflectivity of the reflective element directly determines the optical system A series of important parameters, so the accurate measurement of high reflectivity is of great significance [see literature [1] A.Abramovici, W.E.Althouse, R.W.P.Drever, Y.Gursel, S.Kawamura, F.J.Raab, et al., "Ligo -the Laser-Interferometer-Gravitational-Wave-Observatory, "Science, vol.256, pp.325-333, 1992. [2] W.W.Chow, J.Geabanacloche, L.M.Pedrotti, V.E.Sanders, W.Schleich, and M.O.Scully , "The Ring Laser Gyro," Reviews of Modern Physics, vol.57, pp.61-104, 1985.]. [0003] At present, the optical ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/55
CPCG01N21/55
Inventor 邵建达刘世杰王圣浩
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI