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Droplet type scanning ion conductance microscope and probe and scanning method thereof

A technology of scanning ion conductance and scanning method, which is applied in the field of droplet scanning ion conductance microscope and its probe and scanning, can solve the problems of not considering the sample to be tested, reducing the scanning imaging time, and consuming a lot of time, so as to achieve improvement Effect of measurement stability and precision, reduced disturbance, constant droplet size

Active Publication Date: 2019-01-04
杭州信畅信息科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Literature 【HIROKI IDA, YASUFUMI TAKAHASHI. High Speed ​​Scanning Ion Conductance Microscopy for Quantitative Analysis of Nanoscale Dynamics of Microvilli[J].Analytical Chemistry.2017,89:6015-6020.】There is a probe that collides with the sample to be measured and breaks, which eventually leads to scanning failure risks of
It can be seen that most of the existing literature adopts a point-by-point measurement strategy with constant pixel spacing, but this measurement method does not take into account that there are a large number of non-characteristic areas in the measured samples, especially biological samples, which are not of interest to us. It will consume a lot of time to perform high-resolution scanning imaging of this area, and finally inevitably reduce the total scanning imaging time

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  • Droplet type scanning ion conductance microscope and probe and scanning method thereof
  • Droplet type scanning ion conductance microscope and probe and scanning method thereof
  • Droplet type scanning ion conductance microscope and probe and scanning method thereof

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Embodiment Construction

[0050] The present invention will be further described in detail below in conjunction with specific embodiments, which are explanations of the present invention rather than limitations.

[0051] The scanning method of the droplet scanning ion conductance microscope of the present invention is based on microfluidic chip technology, micro droplet control, mechanical structure design and high-speed imaging algorithm of the scanning ion conductance microscope.

[0052] Aiming at the need to put the measured sample into the conductivity solution medium during the scanning ion conductance microscope scanning process, this condition limits the volume of the measured sample, and the use of a large amount of conductivity solution medium will introduce more electrochemical interference inside the system; this paper The invention proposes a droplet-type scanning ion conductance microscope and its scanning method. The droplet-type scanning ion conductance microscope only cares about the sc...

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Abstract

The invention provides a droplet type scanning ion conductance microscope and a probe and a scanning method thereof. The probe comprises a dual channel microfluidic chip and a [theta] type double-tubeglass tube. The microscope includes a PC machine, an FPGA main controller, a micro flow controller, a loading tray control unit, a probe control unit, and the probe. The scanning method includes thefollowing steps: performing a forward point-by-point coarse scanning of large pixel point spacing on each of scanning lines; recognizing a region of interest, a secondary region of interest, and a region of no interest on the scanning line; performing reverse variable-pixel point spacing scanning on the scanning line; complete forward and reverse scanning on all the scanning lines; and combining measurement point data of the forward coarse scanning and the reverse variable-pixel point spacing scanning of each of the lines to obtain an overall scanned image. Electrochemical interference causedby use of a large amount of conductivity mediums can be avoided, and the imaging precision and the imaging speed of the droplet type scanning ion conductance microscope are improved.

Description

technical field [0001] The invention relates to a scanning ion conductance microscope, in particular to a droplet type scanning ion conductance microscope, a probe and a scanning method thereof. Background technique [0002] Based on scanning tunneling microscope and atomic force microscope, scanning ion conductance microscope (Scanning ionconductance microscopy, SICM) as a new member of the scanning probe microscope family has been widely used in nanoscale biological cells, new materials, medicine, pharmaceuticals and other fields. The biggest advantage of SICM is that it can image the sample morphology without damage and nanometer resolution under liquid physiological conditions. And its operation is relatively simple and does not require complex sample pretreatments such as dehydration, curing, and metal spraying. Therefore, SICM is also widely used in life sciences, electrochemistry, and other fields. [0003] At present, various performances of SICM (mainly including s...

Claims

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Application Information

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IPC IPC(8): G01Q60/44
CPCG01Q60/44
Inventor 庄健王志武程磊
Owner 杭州信畅信息科技有限公司
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