Ultra-precise displacement measuring system based on optical neural network
A technology of neural network and displacement measurement, which is applied in the field of ultra-precision displacement measurement system based on optical neural network, can solve problems such as the influence of measurement accuracy, and achieve the effects of low environmental sensitivity, high resolution and precision, and high integration
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
no. 1 example
[0034] image 3 Schematically shows the structure of the grating ruler displacement measurement system based on the optical neural network 3 of the present invention, that is, the structure of the measurement system when the optical displacement measuring device 2 is a grating ruler, including: a light source 1, an optical displacement measuring device 2, an optical nerve Network 3 , detector array 4 , and signal processing device 5 .
[0035] Such as image 3 As shown, in this embodiment, the light source 1 is an incoherent light source, the optical displacement measuring device 2 is a grating ruler, and the optical neural network 3 is a spatial light modulator 31 .
[0036] The working principle of this embodiment is exactly the same as the working principle of the present invention described above. The grating ruler mainly includes a scale grating 211 and an indicating grating 212. When the two gratings move relative to each other, the Moiré fringe light signal is output a...
no. 2 example
[0038] Figure 4a Schematically shows the structure of the optical interference displacement measurement system based on the optical neural network 3 of the present invention, that is, the structure of the measurement system when the optical displacement measurement device 2 is an optical interferometer, including: a light source 1, an optical displacement measurement device 2, An optical neural network 3 , a detector array 4 , and a signal processing device 5 .
[0039] Such as Figure 4a As shown, in this embodiment, the light source 1 is a single-frequency laser, the optical displacement measuring device 2 is a homodyne laser interferometer, and the optical neural network 3 is a passive optical neural network; wherein, the homodyne laser interferometer includes a first spectroscopic Prism 221 , reference mirror 223 , measurement mirror 222 .
[0040] Compared with the first embodiment, the working principle of this embodiment is that the optical displacement measuring dev...
no. 3 example
[0042] Figure 4b Schematically shows the structure of the optical interference displacement measurement system based on the optical neural network 3 of the present invention, that is, the structure of the measurement system when the optical displacement measurement device 2 is an optical interferometer, which includes: a light source 1, an optical displacement measurement device 2, An optical neural network 3 , a detector array 4 , and a signal processing device 5 .
[0043] Such as Figure 4b As shown, in this embodiment, the light source 1 is a single-frequency laser, the optical displacement measuring device 2 is a homodyne grating interferometer, and the optical neural network 3 is a passive optical neural network; wherein, the homodyne grating interferometer includes a second spectroscopic Prism 231 , reference grating 233 , measurement grating 232 .
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com