Optical module test system and method

Abstract

The invention discloses an optical module test system and a method thereof. The test system comprises an oscilloscope, a power meter, a spectrometer, an optical attenuator, a light source module and abit error detector. The key test indexes of the optical module, such as optical power, an extinction ratio, a spectrum, a channel cost, an overload, a sensitivity, a receiving / emitting terminal monitoring and the like, are integrated into a test link to realize the test. Compared with the prior art, the invention has the following positive effects: 1, under the condition of guaranteeing the module production and testing, the invention realizes: 1, integrates the testing process of the optical module, reduces the software management work, avoids the risk of the software management, reduces thetesting cost and ensures the testing demand; 2, clever link design enhances the efficiency of the instrument; 3, the relativity between the test indexes is established, which is equivalent to the strict test requirements and enhances the reliability of the test results.

Description

technical field [0001] The invention relates to an optical module testing system and method. Background technique [0002] In the production of optical modules, in order to ensure the quality of the modules, it is necessary to test the key indicators of the modules. Key indicators include: optical power, extinction ratio, spectrum, channel cost, overload, sensitivity, receiver / transmitter monitoring, etc. The existing test method is: the test of the channel cost needs a separate test link to be realized, and other index tests except the channel cost need to build another test link. Therefore, the test process is cumbersome in production, and resources such as testers, equipment, and sites are wasted, which increases production costs and reduces test efficiency. Contents of the invention [0003] In order to overcome the shortcomings of the prior art, the present invention provides an optical module testing system and method, which includes the key test indicators of the ...

AI Technical Summary

Problems solved by technology

Therefore, the test process is cumbersome in production, and resources such as testers, equipment, and sites are wasted, which increases production costs and reduces test efficiency.

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